{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,9]],"date-time":"2026-07-09T16:25:58Z","timestamp":1783614358932,"version":"3.55.0"},"reference-count":1,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/ets.2013.6569381","type":"proceedings-article","created":{"date-parts":[[2013,8,2]],"date-time":"2013-08-02T17:16:01Z","timestamp":1375463761000},"page":"1-1","source":"Crossref","is-referenced-by-count":3,"title":["Bias temperature instability analysis in SRAM decoder"],"prefix":"10.1109","author":[{"given":"Seyab","family":"Khan","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Halil","family":"Kukner","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Praveen","family":"Raghavan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Francky","family":"Catthoor","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2006.1705198"}],"event":{"name":"2013 18th IEEE European Test Symposium (ETS)","location":"Avignon, France","start":{"date-parts":[[2013,5,27]]},"end":{"date-parts":[[2013,5,30]]}},"container-title":["2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6558538\/6569335\/06569381.pdf?arnumber=6569381","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T16:35:41Z","timestamp":1490200541000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6569381\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":1,"URL":"https:\/\/doi.org\/10.1109\/ets.2013.6569381","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}