{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T19:35:09Z","timestamp":1725564909559},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/ets.2014.6847794","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T11:18:23Z","timestamp":1406632703000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Detection conditions for errors in self-adaptive better-than-worst-case designs"],"prefix":"10.1109","author":[{"given":"Ilia","family":"Polian","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jie","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adit","family":"Singh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403610"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437666"},{"journal-title":"Latch to Block Short Path Violation","year":"2008","author":"bull","key":"10"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629915"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007148"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2111230"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763153"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1993.580048"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024760"},{"key":"11","article-title":"A 1ghz hardware loop-Accelerator with razor-based dynamic adaptation for energyefficient operation","author":"das","year":"2013","journal-title":"CICC"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1993.580114"}],"event":{"name":"2014 19th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2014,5,26]]},"location":"Paderborn, Germany","end":{"date-parts":[[2014,5,30]]}},"container-title":["2014 19th IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6842412\/6847779\/06847794.pdf?arnumber=6847794","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T13:41:03Z","timestamp":1490276463000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6847794\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ets.2014.6847794","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}