{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T22:56:34Z","timestamp":1768344994787,"version":"3.49.0"},"reference-count":34,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/ets.2014.6847812","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T15:18:23Z","timestamp":1406647103000},"page":"1-6","source":"Crossref","is-referenced-by-count":8,"title":["Fault injection and fault tolerance methodologies for assessing device robustness and mitigating against ionizing radiation"],"prefix":"10.1109","author":[{"given":"Dan","family":"Alexandrescu","sequence":"first","affiliation":[]},{"given":"Luca","family":"Sterpone","sequence":"additional","affiliation":[]},{"given":"Celia","family":"Lopez-Ongil","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/23.983197"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.45"},{"key":"18","author":"aguirre","year":"0","journal-title":"An FPGA-based Hardware Emulator for the Insertion and Analysis of Single Event Upsets in VLSI Designs"},{"key":"33","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2012.6229561"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/32.666826"},{"key":"34","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.07.104"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/23.903784"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2006.24"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/12.364536"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1142\/S0129156404002387"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1998.689479"},{"key":"21","doi-asserted-by":"crossref","first-page":"177","DOI":"10.1007\/0-306-48711-X_11","article-title":"Mefisto: A series of prototype tools for fault injection into vhdl models","volume":"23","author":"arlat","year":"2003","journal-title":"Frontiers in Electronic Testing"},{"key":"20","first-page":"252252","article-title":"Autonomous fault emulation: A new fpgabased acceleration systems for hardness evaluation","volume":"54","author":"lo?pez-ongil","year":"2007","journal-title":"IEEE T on Nulcear Science"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1137\/0108018"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.855790"},{"key":"24","first-page":"671","article-title":"An alpha immune and ultra low neutron ser high density sram","volume":"2004","author":"roche","year":"2004","journal-title":"proceedings of IRPS"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/23.25522"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/23.124134"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"28","first-page":"893","article-title":"Cost-effective approach for reducing the soft error failure rate in logic circuits","author":"moharam","year":"2003","journal-title":"Proc Int Test Conf (ITC)"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2022879"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/23.736549"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1975.4328188"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/32.44380"},{"key":"1","year":"2006","journal-title":"Coderre Jeffrey 22 01 Introduction to Ionizing Radiation Fall"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2013.6727076"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6993-4_10"},{"key":"6","author":"buchner","year":"2002","journal-title":"Proton Test Guideline Development Lessons Learned"},{"key":"32","doi-asserted-by":"publisher","DOI":"10.1145\/1857927.1857934"},{"key":"5","year":"1996","journal-title":"Test Procedures for the Measurement of Single-Event Effecs in Seminconductor Devices from Heavy Ion Irradiation"},{"key":"31","first-page":"162","author":"baigini","year":"2010","journal-title":"SuperB Progress Reporrts The Collider"},{"key":"4","year":"1997","journal-title":"IEEE Standard for Environmental Specifications for Spaceborne Computer Modules"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/2.386985"},{"key":"8","article-title":"Soft errors from space to ground: Historical overview, empirical evidence and future trends","author":"heijmen","year":"2010","journal-title":"Soft Errors in Modern Electronic Systems"}],"event":{"name":"2014 19th IEEE European Test Symposium (ETS)","location":"Paderborn, Germany","start":{"date-parts":[[2014,5,26]]},"end":{"date-parts":[[2014,5,30]]}},"container-title":["2014 19th IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6842412\/6847779\/06847812.pdf?arnumber=6847812","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T17:29:40Z","timestamp":1498152580000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6847812\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/ets.2014.6847812","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}