{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T02:07:04Z","timestamp":1725502024504},"reference-count":39,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/ets.2014.6847818","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T11:18:23Z","timestamp":1406632703000},"page":"1-6","source":"Crossref","is-referenced-by-count":9,"title":["INL systematic reduced-test technique for Pipeline ADCs"],"prefix":"10.1109","author":[{"given":"Eduardo","family":"Peralias","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonio","family":"Gines","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adoracion","family":"Rueda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-009-5130-6"},{"key":"35","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052843"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1049\/el.2009.0203"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.18"},{"key":"36","doi-asserted-by":"publisher","DOI":"10.1109\/4.261994"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1155\/2008\/657207"},{"key":"33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2015703"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.53"},{"key":"34","first-page":"541","article-title":"Auto-calibrating analog timer for on-chip testing","author":"provost","year":"2010","journal-title":"Proc Int Test Conference"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583979"},{"key":"39","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2051062"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-008-5071-5"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401561"},{"key":"37","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-23521-9_7"},{"key":"12","first-page":"792","article-title":"Pipeline adc linearity testing with dramatically reduced data capture time","author":"yu","year":"2005","journal-title":"Proc IEEE Int Symposium on Circuits and Systems"},{"journal-title":"IEEE Standard 1241-2000 for Terminology and Test Methods for Analog-to-Digital Converters","year":"2000","key":"38"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2012.6233009"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2089543"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2013.6548913"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1997.582381"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1997.582382"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840042"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923449"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2692(02)00098-8"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.807415"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.823317"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.803292"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1016\/S0263-2241(01)00043-4"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.821281"},{"key":"1","first-page":"17","article-title":"Production test challenges for highly integrated mobile phone socs-A case study","author":"poehl","year":"2010","journal-title":"Proc IEEE European Test Symposium"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5538029"},{"key":"30","first-page":"221","article-title":"A bist scheme for testing analog-to-digital converters with digital response analyses","author":"wen","year":"2005","journal-title":"Proc IEEE VLSI Test Symposium"},{"key":"6","first-page":"1191","article-title":"Highperformance adc linearity test using low-precision signals in non-stationary environments","author":"jin","year":"2005","journal-title":"Proc International Test Conference"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847240"},{"key":"32","first-page":"2103","article-title":"A high precision ramp generator for low cost adc test","author":"lee","year":"2008","journal-title":"Proc Int Solid State and Integrated Circuit Technology Conf"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2002.1029644"},{"key":"31","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364679"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000029459.74815.56"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.807795"}],"event":{"name":"2014 19th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2014,5,26]]},"location":"Paderborn, Germany","end":{"date-parts":[[2014,5,30]]}},"container-title":["2014 19th IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6842412\/6847779\/06847818.pdf?arnumber=6847818","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T13:53:07Z","timestamp":1490277187000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6847818\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/ets.2014.6847818","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}