{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,6]],"date-time":"2026-06-06T16:22:51Z","timestamp":1780762971693,"version":"3.54.1"},"reference-count":26,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/ets.2014.6847820","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T15:18:23Z","timestamp":1406647103000},"page":"1-8","source":"Crossref","is-referenced-by-count":12,"title":["Reconfigurable high performance architectures: How much are they ready for safety-critical applications?"],"prefix":"10.1109","author":[{"given":"D.","family":"Sabena","sequence":"first","affiliation":[{"name":"Dipartimento di Automatica e Informatica - DAUIN Politecnico di Torino Torino, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"L.","family":"Sterpone","sequence":"additional","affiliation":[{"name":"Dipartimento di Automatica e Informatica - DAUIN Politecnico di Torino Torino, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mario","family":"Scholzel","sequence":"additional","affiliation":[{"name":"Brandenburg University of Technology Department of computer science Cottbus, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tobias","family":"Koal","sequence":"additional","affiliation":[{"name":"Brandenburg University of Technology Department of computer science Cottbus, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"H. T.","family":"Vierhaus","sequence":"additional","affiliation":[{"name":"Brandenburg University of Technology Department of computer science Cottbus, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"S.","family":"Wong","sequence":"additional","affiliation":[{"name":"Computer Engineering Laboratory Delft University of Technology Delft, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"R.","family":"Glein","sequence":"additional","affiliation":[{"name":"RF and Microwave Design Department, Fraunhofer Institute for Integrated Circuits (IIS) Erlangen, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"F.","family":"Rittner","sequence":"additional","affiliation":[{"name":"RF and Microwave Design Department, Fraunhofer Institute for Integrated Circuits (IIS) Erlangen, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"C.","family":"Stender","sequence":"additional","affiliation":[{"name":"RF and Microwave Design Department, Fraunhofer Institute for Integrated Circuits (IIS) Erlangen, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"M.","family":"Porrmann","sequence":"additional","affiliation":[{"name":"University of Bielefeld Bielefeld, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J.","family":"Hagemeyer","sequence":"additional","affiliation":[{"name":"University of Bielefeld Bielefeld, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910870"},{"key":"17","first-page":"1","article-title":"Recent single event effects results in advanced reconfigurable field programmable gate arrays","author":"allen","year":"2011","journal-title":"IEEE Radiation Effects Data Workshop"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2001422"},{"key":"15","first-page":"2014","article-title":"A selfadaptive seu mitigation system for fpgas with an internal block ram radiation particle sensors","author":"glein","year":"0","journal-title":"2014 IEEE 22st Annual International Symposium on Field-Programmable Custom Machines (FCCM"},{"key":"16","first-page":"1","article-title":"Design optimizations for tiled partially reconfigurable systems","author":"koester","year":"2010","journal-title":"IEEE Transactions on VLSI"},{"key":"13","first-page":"23","article-title":"Ensuring fpga reconfiguration in space","author":"glein","year":"2013","journal-title":"Xcell Journal"},{"key":"14","author":"swift","year":"2013","journal-title":"Virtex-5QV static SEU characterization summary"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.2"},{"key":"12","author":"glab","year":"2011","journal-title":"Dependability-Aware System-level Design for Embedded Systems"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-6799-8"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.149"},{"key":"22","first-page":"26","article-title":"High level synthesis technique for reconfigurable datapath structures","author":"guerra","year":"1993","journal-title":"IEEE Conference on Computer Aided Design (ICCAD'93"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/92.661258"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2008.4630073"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/PDP.2013.51"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.243795"},{"key":"3","first-page":"813","article-title":"On the automatic generation of optimized software-based self-test programs for vliw processors,\" very large scale integration (vlsi) systems","volume":"22","author":"sabena","year":"2014","journal-title":"IEEE Transactions on"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569377"},{"key":"10","author":"gaisler","year":"2010","journal-title":"GRLIB IP Library User's Manual"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2013.6673255"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/SAMOS.2012.6404173"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2003.1225960"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2008.4762420"},{"key":"4","doi-asserted-by":"crossref","first-page":"1363","DOI":"10.1109\/TC.2004.104","article-title":"The molen polymorphic processor","volume":"53","author":"stamatis","year":"2004","journal-title":"IEEE Transactions on Computers"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-36812-7_16"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.175"}],"event":{"name":"2014 19th IEEE European Test Symposium (ETS)","location":"Paderborn, Germany","start":{"date-parts":[[2014,5,26]]},"end":{"date-parts":[[2014,5,30]]}},"container-title":["2014 19th IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6842412\/6847779\/06847820.pdf?arnumber=6847820","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,8]],"date-time":"2021-06-08T17:05:48Z","timestamp":1623171948000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6847820\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/ets.2014.6847820","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}