{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T16:57:45Z","timestamp":1729616265123,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/ets.2014.6847822","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T15:18:23Z","timestamp":1406647103000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Using dynamic shift to reduce test data volume in high-compression designs"],"prefix":"10.1109","author":[{"given":"Xijiang","family":"Lin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark","family":"Kassab","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584057"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033794"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.31"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1145\/378239.378388"},{"key":"16","first-page":"748","article-title":"Opmisr: The foundation for compressed atpg vector","author":"keller","year":"2001","journal-title":"Proc Intl Test Conf"},{"key":"13","first-page":"9","article-title":"A reconfigurable shared scan-in architecture","author":"samaranayake","year":"2003","journal-title":"Proc VLSI Test Symp"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387356"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011104"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271096"},{"key":"21","first-page":"321","article-title":"Reducing test data volume using lfsr reseeding with seed compression","author":"krishna","year":"2003","journal-title":"ITC"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990304"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826558"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2205385"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.70"},{"key":"3","doi-asserted-by":"crossref","first-page":"1076","DOI":"10.1109\/TC.2003.1223641","article-title":"Test data compression and test resource partitioning for system-on-chip using frequency-directed run-length (fdr) codes","volume":"52","author":"chandra","year":"2003","journal-title":"Trans on Comp"},{"key":"2","first-page":"237","article-title":"Lfsr-coded test patterns for scan design","author":"koenemann","year":"1991","journal-title":"Proc European Test Conf"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966672"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"7","first-page":"581","article-title":"Test data compression for ip embedded cores using selective encoding of scan slices","author":"wang","year":"2005","journal-title":"Proc Intl Test Conf"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998303"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011119"},{"key":"4","first-page":"355","article-title":"System-on-A-ch te-d a ccztpitn aid deccztpin alchtndtures based on golomb codes","volume":"20","author":"chandm","year":"2001","journal-title":"IEEE Txans onCAD"},{"key":"9","first-page":"369","article-title":"Reducing test application time for build-in self-test pattern generation","author":"hamzaoglu","year":"2000","journal-title":"Proc 6th SCI"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1145\/288548.288563"}],"event":{"name":"2014 19th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2014,5,26]]},"location":"Paderborn, Germany","end":{"date-parts":[[2014,5,30]]}},"container-title":["2014 19th IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6842412\/6847779\/06847822.pdf?arnumber=6847822","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T17:29:40Z","timestamp":1498152580000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6847822\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/ets.2014.6847822","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}