{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,16]],"date-time":"2026-02-16T09:35:28Z","timestamp":1771234528821,"version":"3.50.1"},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/ets.2014.6847833","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T15:18:23Z","timestamp":1406647103000},"page":"1-2","source":"Crossref","is-referenced-by-count":6,"title":["Automatic correction of certain design errors using mutation technique"],"prefix":"10.1109","author":[{"given":"Payman","family":"Behnam","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bijan","family":"Alizadeh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zainalabedin","family":"Navabi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2012.6165043"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852031"},{"key":"1","author":"rashinkar","year":"2000","journal-title":"System-on-A-Chip Verication Methodology and Techniques"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/43.3141"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/54.895006"}],"event":{"name":"2014 19th IEEE European Test Symposium (ETS)","location":"Paderborn, Germany","start":{"date-parts":[[2014,5,26]]},"end":{"date-parts":[[2014,5,30]]}},"container-title":["2014 19th IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6842412\/6847779\/06847833.pdf?arnumber=6847833","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T17:53:09Z","timestamp":1490291589000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6847833\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/ets.2014.6847833","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}