{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,8]],"date-time":"2025-11-08T22:41:05Z","timestamp":1762641665869},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/ets.2014.6847835","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T15:18:23Z","timestamp":1406647103000},"source":"Crossref","is-referenced-by-count":8,"title":["GPU-based timing-aware test generation for small delay defects"],"prefix":"10.1109","author":[{"given":"Kuan-Yu","family":"Liao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Po-Juei","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ang-Feng","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"James Chien-Mo","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael S.","family":"Hsiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Laung-Terng","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.32"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2005.1466179"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299224"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488769"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2006.57"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469619"}],"event":{"name":"2014 19th IEEE European Test Symposium (ETS)","location":"Paderborn, Germany","start":{"date-parts":[[2014,5,26]]},"end":{"date-parts":[[2014,5,30]]}},"container-title":["2014 19th IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6842412\/6847779\/06847835.pdf?arnumber=6847835","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T18:08:54Z","timestamp":1490292534000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6847835\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/ets.2014.6847835","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}