{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T02:48:39Z","timestamp":1725504519228},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/ets.2014.6847845","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T15:18:23Z","timestamp":1406647103000},"page":"1-2","source":"Crossref","is-referenced-by-count":2,"title":["Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs"],"prefix":"10.1109","author":[{"given":"Fernanda Lima","family":"Kastensmidt","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jorge","family":"Tonfat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thiago","family":"Both","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paolo","family":"Rech","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gilson","family":"Wirth","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ricardo","family":"Reis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Florent","family":"Bruguier","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pascal","family":"Benoit","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lionel","family":"Torres","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christopher","family":"Frost","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.35"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2011.15"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2005.1568543"}],"event":{"name":"2014 19th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2014,5,26]]},"location":"Paderborn, Germany","end":{"date-parts":[[2014,5,30]]}},"container-title":["2014 19th IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6842412\/6847779\/06847845.pdf?arnumber=6847845","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T15:51:51Z","timestamp":1490284311000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6847845\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/ets.2014.6847845","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}