{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T15:08:54Z","timestamp":1729609734337,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/ets.2015.7138770","type":"proceedings-article","created":{"date-parts":[[2015,7,6]],"date-time":"2015-07-06T21:22:30Z","timestamp":1436217750000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Improve the compression ratios for code-based test vector compressions by decomposing"],"prefix":"10.1109","author":[{"given":"Jishun","family":"Kuang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liang","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhiqiang","family":"You","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yingbo","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"644","DOI":"10.1109\/TCAD.2011.2176733","article-title":"2n Pattern Run-Length for Test Data Compression","volume":"31","author":"lung-jen","year":"2012","journal-title":"IEEE Trans on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"ref11","first-page":"538","article-title":"Test Data Compression Based on the Reuse of Parts of the EDictionary Entries","author":"sismanoglou","year":"2011","journal-title":"Proc IEEE Int Conf Electronics Circuits Systems"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1057"},{"key":"ref13","article-title":"Binary Fourier Representation","author":"ohnsorg","year":"1966","journal-title":"Spectrum Analysis Techniques Symposium"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469572"},{"key":"ref15","first-page":"443","article-title":"BIST\/Test-Decompressor Design using Combinational Test Spectrum","author":"yogi","year":"2009","journal-title":"Proc VLSI Design And Test Symp"},{"key":"ref16","first-page":"84","author":"chin","year":"1984","journal-title":"Weighted Pattern Generation for Built-In Self-Test Technical Report (CRC TR)"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"610","DOI":"10.1109\/TCAD.2011.2172609","article-title":"Viterbi-Based Efficient Test Data Compression","volume":"31","author":"dongsoo","year":"2012","journal-title":"IEEE Trans Computer-aided Design of Integrated Circuit and Systems"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"776","DOI":"10.1109\/TCAD.2004.826558","article-title":"Embedded Deterministic Test","volume":"23","author":"janusz","year":"2004","journal-title":"IEEE Trans Computer-aided Design of Integrated Circuit and Systems"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1223641"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/43.913754"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20070028"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.811451"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1044111.1044117"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.807895"},{"key":"ref2","first-page":"458","article-title":"Test Vector Compression via Cyclical Scan Chains and Its Application to Testing Core-Based Designs","author":"jas","year":"1998","journal-title":"IEEE Proc Int'l Test Conf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"ref9","first-page":"2537","article-title":"Test Data Compression Based on Variable Prefix Dual-Run-Length Code","author":"yang","year":"2012","journal-title":"Proc IEEE Instrumentation and Measurement Technology Conference"}],"event":{"name":"2015 20th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2015,5,25]]},"location":"Cluj-Napoca, Romania","end":{"date-parts":[[2015,5,29]]}},"container-title":["2015 20th IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7127855\/7138715\/07138770.pdf?arnumber=7138770","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T15:12:24Z","timestamp":1498230744000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7138770\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/ets.2015.7138770","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}