{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T11:48:20Z","timestamp":1725709700800},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/ets.2017.7968225","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T17:54:01Z","timestamp":1499709241000},"page":"1-2","source":"Crossref","is-referenced-by-count":6,"title":["A very low cost and highly parallel DfT method for analog and mixed-signal circuits"],"prefix":"10.1109","author":[{"given":"Baris","family":"Esen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anthony","family":"Coyette","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nektar","family":"Xama","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wim","family":"Dobbelaere","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ronny","family":"Vanhooren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georges","family":"Gielen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/19.106284"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/43.21830"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512618"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000009312.02003.04"},{"key":"ref7","article-title":"Method to improve analog fault coverage","author":"esen","year":"0","journal-title":"patent pending 2016"},{"key":"ref2","first-page":"319","article-title":"A test point insertion algorithm for mixed-signal circuits","author":"zhang","year":"1999","journal-title":"VLSI Test Symposium 1999 Proceedings 17th IEEE IEEE"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035330"}],"event":{"name":"2017 22nd IEEE European Test Symposium (ETS)","start":{"date-parts":[[2017,5,22]]},"location":"Limassol, Cyprus","end":{"date-parts":[[2017,5,26]]}},"container-title":["2017 22nd IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7960777\/7968199\/07968225.pdf?arnumber=7968225","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,8,16]],"date-time":"2017-08-16T11:45:01Z","timestamp":1502883901000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7968225\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/ets.2017.7968225","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}