{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:07:59Z","timestamp":1729620479977,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/ets.2017.7968229","type":"proceedings-article","created":{"date-parts":[[2017,7,10]],"date-time":"2017-07-10T17:54:01Z","timestamp":1499709241000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["ROM fault diagnosis for O(n<sup>2<\/sup>) test algorithms"],"prefix":"10.1109","author":[{"given":"Artur","family":"Pogiel","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jerzy","family":"Tyszer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-0938-1"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2014.6868760"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.Design.2009.15"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"64","DOI":"10.1109\/MC.2010.334","article-title":"Ring Generator: An Ultimate Linear Feedback Shift Register","volume":"44","author":"mrugalski","year":"2011","journal-title":"IEEE Computer"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519734"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/12.280803"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"645","DOI":"10.1023\/A:1027422805851","volume":"19","author":"rajski","year":"2003","journal-title":"Journal of Electronic Testing Theory and Applications (JETTA)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831584"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.11"},{"journal-title":"Combinatorial Designs Construction Methods","year":"1990","author":"anderson","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2127030"},{"journal-title":"High Performance Memory Testing Design Principles Fault Modeling and Self-Test","year":"2003","author":"adams","key":"ref1"}],"event":{"name":"2017 22nd IEEE European Test Symposium (ETS)","start":{"date-parts":[[2017,5,22]]},"location":"Limassol, Cyprus","end":{"date-parts":[[2017,5,26]]}},"container-title":["2017 22nd IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7960777\/7968199\/07968229.pdf?arnumber=7968229","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,29]],"date-time":"2019-09-29T06:34:30Z","timestamp":1569738870000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7968229\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ets.2017.7968229","relation":{},"subject":[],"published":{"date-parts":[[2017,5]]}}}