{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,19]],"date-time":"2026-08-19T19:57:22Z","timestamp":1787169442509,"version":"build-2736575974"},"reference-count":30,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/ets.2018.8400694","type":"proceedings-article","created":{"date-parts":[[2018,7,2]],"date-time":"2018-07-02T20:00:42Z","timestamp":1530561642000},"page":"1-6","source":"Crossref","is-referenced-by-count":7,"title":["The impact of production defects on the soft-error tolerance of hardened latches"],"prefix":"10.1109","author":[{"given":"Stefan","family":"Holst","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ruijun","family":"Ma","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaoqing","family":"Wen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref30","year":"0","journal-title":"Predictive Technology Model for Spice"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1057661.1057740"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2004.1358812"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2177135"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313302"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699229"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386963"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700604"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2014.6868814"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2010.19"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197722"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2008.31"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.14"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.137"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2005.70"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0099"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675742"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1070"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2014.16"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.24"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5533-5"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2637876"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862738"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2637873"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1147\/rd.523.0275"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.274"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.44"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2006.1594762"}],"event":{"name":"2018 IEEE European Test Symposium (ETS)","location":"Bremen","start":{"date-parts":[[2018,5,28]]},"end":{"date-parts":[[2018,6,1]]}},"container-title":["2018 IEEE 23rd European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8392663\/8400674\/08400694.pdf?arnumber=8400694","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T09:52:31Z","timestamp":1643190751000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8400694\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/ets.2018.8400694","relation":{},"subject":[],"published":{"date-parts":[[2018,5]]}}}