{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T10:58:43Z","timestamp":1725706723039},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/ets.2019.8791506","type":"proceedings-article","created":{"date-parts":[[2019,8,8]],"date-time":"2019-08-08T23:48:50Z","timestamp":1565308130000},"page":"1-2","source":"Crossref","is-referenced-by-count":2,"title":["PaTran: Translation Platform for Test Pattern Program"],"prefix":"10.1109","author":[{"given":"Jung-Geun","family":"Park","sequence":"first","affiliation":[]},{"given":"Minsu","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Soo-Mook","family":"Moon","sequence":"additional","affiliation":[]},{"given":"Sungyeol","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Insu","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Hyunsoo","family":"Jung","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557125"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342393"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/EDAC.1990.136613"},{"key":"ref6","article-title":"WaveDrom: rendering beautiful waveforms from plain text","author":"chapyzhenka","year":"0","journal-title":"Synopsys User Group (SNUG) Silicon Valley 2016 Proceedings"},{"journal-title":"unpublished","article-title":"A dynamic intermediate representation for translation of test pattern programs","year":"0","key":"ref5"},{"journal-title":"unpublished","article-title":"Design and Implementation of PaTran for translation of test pattern program","year":"0","key":"ref8"},{"journal-title":"Node js","year":"0","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557091"},{"journal-title":"The Llvm Compiler Infrastructure Project","year":"0","key":"ref9"},{"journal-title":"IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data","article-title":"IEEE-SA Standards Board","year":"1999","key":"ref1"}],"event":{"name":"2019 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2019,5,27]]},"location":"Baden-Baden, Germany","end":{"date-parts":[[2019,5,31]]}},"container-title":["2019 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8784130\/8791505\/08791506.pdf?arnumber=8791506","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:47:51Z","timestamp":1658094471000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8791506\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ets.2019.8791506","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}