{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,31]],"date-time":"2024-08-31T05:49:54Z","timestamp":1725083394453},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/ets.2019.8791512","type":"proceedings-article","created":{"date-parts":[[2019,8,8]],"date-time":"2019-08-08T23:48:50Z","timestamp":1565308130000},"source":"Crossref","is-referenced-by-count":5,"title":["LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology"],"prefix":"10.1109","author":[{"given":"Soumya","family":"Mittal","sequence":"first","affiliation":[]},{"given":"R.D.","family":"Blanton","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470717"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041767"},{"key":"ref11","first-page":"248","article-title":"Diagnosis of byzantine open-segment faults","author":"huang","year":"2002","journal-title":"IEEE Asian Test Symposium"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743310"},{"key":"ref13","article-title":"On per-test fault diagnosis using the X-fault model","author":"wen","year":"2004","journal-title":"IEEE International Conference on Computer Aided Design"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2008.4538798"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2003.1250816"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2014.22"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699231"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2016.46"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2611499"},{"key":"ref28","article-title":"OpenSPARC: An open platform for hardware reliability experimentation","author":"parulkar","year":"2008","journal-title":"Workshop on Silicon Errors in Logic-System Effects"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178587"},{"key":"ref27","author":"witten","year":"2016","journal-title":"Data Mining Practical Machine Learning Tools and Techniques"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178386"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1997.643595"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/54.867894"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2113670"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966644"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894213"},{"key":"ref2","author":"niewenhuis","year":"2018","journal-title":"A logic test chip for optimal test and diagnosis"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.896641"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2406854"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2017.48"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2587283"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297661"},{"key":"ref23","article-title":"NOIDA: Noise-resistant intra-cell diagnosis","year":"2018","journal-title":"IEEE VLSI Test Symposium"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297627"}],"event":{"name":"2019 IEEE European Test Symposium (ETS)","location":"Baden-Baden, Germany","start":{"date-parts":[[2019,5,27]]},"end":{"date-parts":[[2019,5,31]]}},"container-title":["2019 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8784130\/8791505\/08791512.pdf?arnumber=8791512","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:54:12Z","timestamp":1658094852000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8791512\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/ets.2019.8791512","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}