{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T07:04:01Z","timestamp":1751094241752,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/ets.2019.8791533","type":"proceedings-article","created":{"date-parts":[[2019,8,8]],"date-time":"2019-08-08T23:48:50Z","timestamp":1565308130000},"page":"1-6","source":"Crossref","is-referenced-by-count":11,"title":["Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection"],"prefix":"10.1109","author":[{"given":"Mehmet","family":"Ince","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ender","family":"Yilmaz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei","family":"Fu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joonsung","family":"Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Krishnaswamy","family":"Nagaraj","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"LeRoy","family":"Winemberg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sule","family":"Ozev","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/ETS.2007.35"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TEST.2010.5699243"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"141","DOI":"10.1109\/82.917782","article-title":"An all-digital built-in self-test for high-speed phase-locked loops","volume":"48","author":"kim","year":"2001","journal-title":"IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TEST.2015.7342385"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/DATE.2012.6176656"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/9780470545331"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TEST.2017.8242033"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/VTS.2015.7116250"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TPEL.2009.2020588"},{"key":"ref19","first-page":"36","article-title":"Adaptive-learning-based importance sampling for analog circuit dppm estimation","volume":"32","author":"yilmaz","year":"2015","journal-title":"IEEE Design Test"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/MDT.2004.38"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/VTEST.2000.843850"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/WISP.2013.6657490"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/ATS.1997.643984"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/4.661214"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ATS.2009.23"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TIM.2005.847343"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TEST.1999.805777"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TIM.2007.910109"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/VTS.2011.5783780"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.7873\/DATE.2013.125"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/TCAD.2008.917578"}],"event":{"name":"2019 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2019,5,27]]},"location":"Baden-Baden, Germany","end":{"date-parts":[[2019,5,31]]}},"container-title":["2019 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8784130\/8791505\/08791533.pdf?arnumber=8791533","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:47:51Z","timestamp":1658094471000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8791533\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/ets.2019.8791533","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}