{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T16:55:31Z","timestamp":1730220931142,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/ets.2019.8791539","type":"proceedings-article","created":{"date-parts":[[2019,8,8]],"date-time":"2019-08-08T23:48:50Z","timestamp":1565308130000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation"],"prefix":"10.1109","author":[{"given":"Ghazanfar","family":"Ali","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jerrin","family":"Pathrose","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hans G.","family":"Kerkhoff","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","first-page":"117","DOI":"10.1109\/JSSC.2015.2463083","article-title":"A 409 GOPS\/W Adaptive and Resilient Domino Register File in 22 nm Tri-Gate CMOS Featuring In-Situ Timing Margin and Error Detection for Tolerance to Within-Die Variation, Voltage Droop, Temperature and Aging","volume":"51","author":"kulkarni","year":"2016","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2670644"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2019.8704570"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"398","DOI":"10.1109\/ISSCC.2007.373462","article-title":"A Distributed Critical-Path Timing Monitor for a 65nm High-Performance Microprocessor","author":"drake","year":"2007","journal-title":"IEEE International Solid-State Circuits Conference Digest of Technical Papers"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469568"},{"journal-title":"IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device","first-page":"1","year":"2014","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2018.8349691"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2018.2844601"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2016.7519301"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433996"}],"event":{"name":"2019 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2019,5,27]]},"location":"Baden-Baden, Germany","end":{"date-parts":[[2019,5,31]]}},"container-title":["2019 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8784130\/8791505\/08791539.pdf?arnumber=8791539","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:54:11Z","timestamp":1658094851000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8791539\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ets.2019.8791539","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}