{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:24:29Z","timestamp":1725593069997},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/ets.2019.8791540","type":"proceedings-article","created":{"date-parts":[[2019,8,8]],"date-time":"2019-08-08T23:48:50Z","timestamp":1565308130000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition"],"prefix":"10.1109","author":[{"given":"T.","family":"Vayssade","sequence":"first","affiliation":[]},{"given":"F.","family":"Azais","sequence":"additional","affiliation":[]},{"given":"L.","family":"Latorre","sequence":"additional","affiliation":[]},{"given":"F.","family":"Lefevre","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2016.2590978"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035303"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.38"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-011-5222-y"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2018.8474229"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2015.7138761"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035301"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139142"},{"key":"ref9","first-page":"380","article-title":"An on-chip short-time interval measurement technique for testing high-speed communication links","author":"huang","year":"2001","journal-title":"Proc IEEE VLSI Test Symposium (VTS)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297704"}],"event":{"name":"2019 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2019,5,27]]},"location":"Baden-Baden, Germany","end":{"date-parts":[[2019,5,31]]}},"container-title":["2019 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8784130\/8791505\/08791540.pdf?arnumber=8791540","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:54:12Z","timestamp":1658094852000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8791540\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ets.2019.8791540","relation":{},"subject":[],"published":{"date-parts":[[2019,5]]}}}