{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T08:51:21Z","timestamp":1725699081164},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/ets48528.2020.9131559","type":"proceedings-article","created":{"date-parts":[[2020,7,2]],"date-time":"2020-07-02T21:06:26Z","timestamp":1593723986000},"page":"1-2","source":"Crossref","is-referenced-by-count":3,"title":["Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level"],"prefix":"10.1109","author":[{"given":"Lizhou","family":"Wu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Moritz","family":"Fieback","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mottaqiallah","family":"Taouil","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624895"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624749"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.206"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000029458.57095.bb"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000134"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2019.8791518"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2019.2960375"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805831"},{"journal-title":"Survey on STT-MRAM testing Failure mechanisms fault models and tests","year":"2020","author":"wu","key":"ref9"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1998","author":"van de goor","key":"ref1"}],"event":{"name":"2020 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2020,5,25]]},"location":"Tallinn, Estonia","end":{"date-parts":[[2020,5,29]]}},"container-title":["2020 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125440\/9131553\/09131559.pdf?arnumber=9131559","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:53:45Z","timestamp":1656345225000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9131559\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ets48528.2020.9131559","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}