{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T01:02:24Z","timestamp":1725584544557},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/ets48528.2020.9131573","type":"proceedings-article","created":{"date-parts":[[2020,7,2]],"date-time":"2020-07-02T17:06:26Z","timestamp":1593709586000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Automated Graph-Based Fault Injection Into Virtual Prototypes for Robustness Evaluation"],"prefix":"10.1109","author":[{"given":"Jo","family":"Laufenberg","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thomas","family":"Kropf","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Oliver","family":"Bringmann","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2008.25"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484713"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1316550.1316559"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2009.5270313"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2016.7748256"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DepCoS-RELCOMEX.2009.41"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.17"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837333"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/32.666826"},{"journal-title":"Federal Ministry of Education and Research (2018 Sep) the new High-Tech strategy","year":"0","key":"ref1"}],"event":{"name":"2020 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2020,5,25]]},"location":"Tallinn, Estonia","end":{"date-parts":[[2020,5,29]]}},"container-title":["2020 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125440\/9131553\/09131573.pdf?arnumber=9131573","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T11:53:45Z","timestamp":1656330825000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9131573\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ets48528.2020.9131573","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}