{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:34:15Z","timestamp":1764174855216,"version":"3.28.0"},"reference-count":36,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/ets48528.2020.9131578","type":"proceedings-article","created":{"date-parts":[[2020,7,2]],"date-time":"2020-07-02T17:06:26Z","timestamp":1593709586000},"page":"1-10","source":"Crossref","is-referenced-by-count":13,"title":["PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community"],"prefix":"10.1109","author":[{"given":"Amir Ali","family":"Pour","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincent","family":"Beroulle","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bertrand","family":"Cambou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Luc","family":"Danger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Giorgio","family":"Di Natale","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Hely","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sylvain","family":"Guilley","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Naghmeh","family":"Karimi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-44709-3_27"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2013.6581556"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855586"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-018-5745-6"},{"key":"ref36","article-title":"Self-Secured PUF: Protecting the Loop PUF by Masking","author":"tebelmann","year":"0","journal-title":"Constructive Side-Channel Analysis and Secure Design-10th International Workshop COSADE"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2013.6581559"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/2072274.2072276"},{"key":"ref10","first-page":"219","article-title":"Scan design and secure chip","author":"hely","year":"0","journal-title":"Proceedings 10th IEEE International On-Line Testing Symposium"},{"key":"ref11","first-page":"486","article-title":"Security challenges during vlsi test","author":"h\u00e9ly","year":"0","journal-title":"2011 IEEE 9th International New Circuits and systems conference"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041898"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041803"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.244019"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME.2018.8430366"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IVSW.2018.8494852"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2018.8565728"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714862"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33027-8_17"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/2487726.2487730"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ReConFig.2010.24"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2012.22"},{"key":"ref3","first-page":"314","article-title":"Development of the Unified Security Requirements of PUFs During the Standardization Process","volume":"11359","author":"bruneau","year":"2018","journal-title":"Innovative Security Solutions for Information Technology and Communications-11th International Conference SecITC 2018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2018.00096"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2012.6263957"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511780448.012"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IWASI.2019.8791249"},{"journal-title":"ISO\/IEC NP 20897 Information technology - Security techniques - Security requirements test and evaluation methods for physically unclonable functions for generating nonstored security parameters","year":"0","author":"guilley","key":"ref2"},{"key":"ref9","article-title":"A proposal for: Functionality classes for random number generators","author":"killmann","year":"2011","journal-title":"Bundesamt für Sicherheit in der Informationstechnik (BSI)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-012-0046-y"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-24676-3_31"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/iet-ifs.2010.0238"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/EDCC-7.2008.11"},{"journal-title":"Nangate 45nm open cell library","year":"0","key":"ref24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131580"},{"key":"ref26","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1145\/1278480.1278484","article-title":"physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4542135"}],"event":{"name":"2020 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2020,5,25]]},"location":"Tallinn, Estonia","end":{"date-parts":[[2020,5,29]]}},"container-title":["2020 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125440\/9131553\/09131578.pdf?arnumber=9131578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T11:53:46Z","timestamp":1656330826000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9131578\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/ets48528.2020.9131578","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}