{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T00:41:20Z","timestamp":1776127280388,"version":"3.50.1"},"reference-count":33,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/ets48528.2020.9131585","type":"proceedings-article","created":{"date-parts":[[2020,7,2]],"date-time":"2020-07-02T21:06:26Z","timestamp":1593723986000},"page":"1-6","source":"Crossref","is-referenced-by-count":16,"title":["Test Sequence-Optimized BIST for Automotive Applications"],"prefix":"10.1109","author":[{"given":"Bartosz","family":"Kaczmarek","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Grzegorz","family":"Mrugalski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nilanjan","family":"Mukherjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lukasz","family":"Rybak","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jerzy","family":"Tyszer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2002.1181727"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2606248"},{"key":"ref31","first-page":"1057","article-title":"Deterministic BIST with multiple scan chains","author":"wunderlich","year":"0","journal-title":"Proc ITC"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569803"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894197"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831593"},{"key":"ref12","first-page":"894","article-title":"Two-dimensional test data compression for scan-based deterministic BIST","author":"liang","year":"0","journal-title":"Proc ITC"},{"key":"ref13","article-title":"Test time and area optimized BIST scheme for automotive ICs","author":"liu","year":"0","journal-title":"Proc ITC"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624872"},{"key":"ref15","article-title":"The price tag of automotive electronics: What's really at play?","author":"mathas","year":"2017","journal-title":"EDN Network"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805826"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2597214"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831584"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114081"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/43.863645"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2006.12"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/43.918212"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041754"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894274"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/43.55187"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437611"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.837985"},{"key":"ref7","article-title":"Understanding ISO 26262 ASILs","author":"hobbs","year":"2013","journal-title":"Electronic Design"},{"key":"ref2","first-page":"506","article-title":"Timing-driven test point insertion for full-scan and partial-scan BIST","author":"cheng","year":"0","journal-title":"Proc ITC"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2717844"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/43.511581"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1997.643983"},{"key":"ref22","first-page":"253","article-title":"Test point insertion for scan-based BIST","author":"seiss","year":"0","journal-title":"Proc ETC"},{"key":"ref21","article-title":"Managing product lifecycles in automotive electronics","author":"rajski","year":"0","journal-title":"Int Conf on Life Cycle Management Pozna? Poland 2019 the keynote presentation"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557122"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.260953"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512668"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2051096"}],"event":{"name":"2020 IEEE European Test Symposium (ETS)","location":"Tallinn, Estonia","start":{"date-parts":[[2020,5,25]]},"end":{"date-parts":[[2020,5,29]]}},"container-title":["2020 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125440\/9131553\/09131585.pdf?arnumber=9131585","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:53:45Z","timestamp":1656345225000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9131585\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/ets48528.2020.9131585","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}