{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T17:42:25Z","timestamp":1780508545345,"version":"3.54.1"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/ets48528.2020.9131602","type":"proceedings-article","created":{"date-parts":[[2020,7,2]],"date-time":"2020-07-02T17:06:26Z","timestamp":1593709586000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics"],"prefix":"10.1109","author":[{"given":"Nektar","family":"Xama","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jakob","family":"Raymaekers","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Martin","family":"Andraud","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jhon","family":"Gomez","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wim","family":"Dobbelaere","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ronny","family":"Vanhooren","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Anthony","family":"Coyette","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Georges","family":"Gielen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IPTA.2017.8310124"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624714"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035344"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035326"},{"key":"ref14","article-title":"Analog fault coverage improvement using final-test dynamic part average testing","author":"w d","year":"2016","journal-title":"ITC"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2012.2206552"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342391"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651892"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9868.2005.00503.x"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624870"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2018.2799800"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.18"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2017.7968215"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805837"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139178"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758607"},{"key":"ref1","year":"2016","journal-title":"IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2783302"}],"event":{"name":"2020 IEEE European Test Symposium (ETS)","location":"Tallinn, Estonia","start":{"date-parts":[[2020,5,25]]},"end":{"date-parts":[[2020,5,29]]}},"container-title":["2020 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9125440\/9131553\/09131602.pdf?arnumber=9131602","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T11:53:45Z","timestamp":1656330825000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9131602\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/ets48528.2020.9131602","relation":{},"subject":[],"published":{"date-parts":[[2020,5]]}}}