{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:07:59Z","timestamp":1740100079994,"version":"3.37.3"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,24]],"date-time":"2021-05-24T00:00:00Z","timestamp":1621814400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,24]],"date-time":"2021-05-24T00:00:00Z","timestamp":1621814400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,24]],"date-time":"2021-05-24T00:00:00Z","timestamp":1621814400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100017055","name":"NSFC-Shandong Joint Fund","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100017055","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,24]]},"DOI":"10.1109\/ets50041.2021.9465381","type":"proceedings-article","created":{"date-parts":[[2021,6,29]],"date-time":"2021-06-29T20:23:46Z","timestamp":1624998226000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["ESD-PCM: Constructing Reliable Super Dense Phase Change Memory Under Write Disturbance"],"prefix":"10.1109","author":[{"given":"Wenke","family":"Jin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siqi","family":"Lu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaojun","family":"Cai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"216","article-title":"Mitigating write disturbance in superdense phase change memories","author":"jiang","year":"2014","journal-title":"IEEE\/IFIP International Conference on Dependable Systems and Networks"},{"article-title":"Frequent pattern compression: A significance-based compression scheme for l2 caches","year":"2004","author":"alameldeen","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1816038.1815980"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116188"},{"key":"ref14","first-page":"253","article-title":"Cost-effective Write Disturbance Mitigation Techniques for Advancing PCM Density","author":"tavana","year":"2017","journal-title":"IEEE\/ACM International Conference on Computer-Aided Design"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MASCOTS.2018.00013"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1145\/2024716.2024718","article-title":"The gem5 simulator","volume":"39","author":"binkert","year":"2011","journal-title":"ACM SIGARCH Computer Architecture News"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1454115.1454128"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2015.7056043"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.377981"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/computers6010008"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2010.5556226"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669157"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131542"},{"key":"ref7","first-page":"46","article-title":"A 20 nm 1.8V 8Gb PRAM with 40MB\/s program bandwidth","author":"choi","year":"2012","journal-title":"Solid-State Circuits Conference Digest of Technical Papers"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1555815.1555759"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2016.2546199"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2694344.2694352"}],"event":{"name":"2021 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2021,5,24]]},"location":"Bruges, Belgium","end":{"date-parts":[[2021,5,28]]}},"container-title":["2021 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9465371\/9465372\/09465381.pdf?arnumber=9465381","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:45:20Z","timestamp":1652197520000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9465381\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,24]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/ets50041.2021.9465381","relation":{},"subject":[],"published":{"date-parts":[[2021,5,24]]}}}