{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T18:44:32Z","timestamp":1771613072265,"version":"3.50.1"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,24]],"date-time":"2021-05-24T00:00:00Z","timestamp":1621814400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,24]],"date-time":"2021-05-24T00:00:00Z","timestamp":1621814400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,24]],"date-time":"2021-05-24T00:00:00Z","timestamp":1621814400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,24]]},"DOI":"10.1109\/ets50041.2021.9465391","type":"proceedings-article","created":{"date-parts":[[2021,6,29]],"date-time":"2021-06-29T16:23:46Z","timestamp":1624983826000},"page":"1-4","source":"Crossref","is-referenced-by-count":4,"title":["Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring"],"prefix":"10.1109","author":[{"given":"Kazuki","family":"Monta","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leonidas","family":"Kataselas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ferenc","family":"Fodor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alkis","family":"Hatzopoulos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Makoto","family":"Nagata","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Erik Jan","family":"Marinissen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2017.54"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2920082"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/43.848088"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.77"},{"key":"ref11","year":"2005","journal-title":"IEEE Standard Testability Method for Embedded Core-Based Integrated Circuits"},{"key":"ref5","first-page":"365","article-title":"Dark silicon and the end of multicore scaling","author":"esmaeilzadeh","year":"2011","journal-title":"2011 38th Annual International Symposium on Computer Architecture (ISCA)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.812295"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.80"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624803"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/PATMOS.2017.8106969"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743146"}],"event":{"name":"2021 IEEE European Test Symposium (ETS)","location":"Bruges, Belgium","start":{"date-parts":[[2021,5,24]]},"end":{"date-parts":[[2021,5,28]]}},"container-title":["2021 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9465371\/9465372\/09465391.pdf?arnumber=9465391","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T11:45:20Z","timestamp":1652183120000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9465391\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,24]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/ets50041.2021.9465391","relation":{},"subject":[],"published":{"date-parts":[[2021,5,24]]}}}