{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T17:06:47Z","timestamp":1781284007191,"version":"3.54.1"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,23]],"date-time":"2022-05-23T00:00:00Z","timestamp":1653264000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,23]],"date-time":"2022-05-23T00:00:00Z","timestamp":1653264000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,23]]},"DOI":"10.1109\/ets54262.2022.9810416","type":"proceedings-article","created":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T19:37:54Z","timestamp":1656704274000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization"],"prefix":"10.1109","author":[{"given":"Hussam","family":"Amrouch","sequence":"first","affiliation":[{"name":"University of Stuttgart,Stuttgart,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[{"name":"Duke University,Durham,NC,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Dirk","family":"Pfluger","sequence":"additional","affiliation":[{"name":"University of Stuttgart,Stuttgart,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ilia","family":"Polian","sequence":"additional","affiliation":[{"name":"University of Stuttgart,Stuttgart,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Matthias","family":"Sauer","sequence":"additional","affiliation":[{"name":"Advantest Europe GmbH"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3065919"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2019.8791553"},{"key":"ref12","article-title":"Graph neural network-based delay-fault localization for monolithic 3D ICs","author":"hung","year":"2022","journal-title":"Proc Design Automation and Test in Europe (DATE) Conf"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1515\/9781400874668"},{"key":"ref14","article-title":"Algorithms for hyper-parameter optimization","volume":"24","author":"bergstra","year":"2011","journal-title":"Advances in neural information processing systems"},{"key":"ref15","author":"liao","year":"2020","journal-title":"Feature selection using batch-wise attenuation and feature mask normalization"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLA52953.2021.00220"},{"key":"ref17","author":"domanski","year":"2021","journal-title":"Self-learning tuning for post-silicon validation"},{"key":"ref18","article-title":"Learning to optimize","author":"li","year":"2016"},{"key":"ref19","first-page":"3751","article-title":"Learned optimizers that scale and generalize","author":"wichrowska","year":"2017","journal-title":"International Conference on Machine Learning"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2017.7928919"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50571.2021.00020"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2008.4751867"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139174"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2017.7928956"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401595"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401547"},{"key":"ref2","first-page":"38:1","article-title":"Finegrained adaptive testing based on quality prediction","volume":"25","author":"liu","year":"2020","journal-title":"ACM Trans Design Autom Electr Syst"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3031865"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2020.3031857"},{"key":"ref20","first-page":"748","article-title":"Learning to learn without gradient descent by gradient descent","author":"chen","year":"2017","journal-title":"International Conference on Machine Learning"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1093\/comjnl\/7.2.155"},{"key":"ref21","first-page":"115","article-title":"Making a science of model search: Hyperparameter optimization in hundreds of dimensions for vision architectures","author":"bergstra","year":"2013","journal-title":"International Conference on Machine Learning"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-00510-8"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s12559-009-9009-8"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-0410-3"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/BIOCAS.2018.8584751"}],"event":{"name":"2022 IEEE European Test Symposium (ETS)","location":"Barcelona, Spain","start":{"date-parts":[[2022,5,23]]},"end":{"date-parts":[[2022,5,27]]}},"container-title":["2022 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9810327\/9810358\/09810416.pdf?arnumber=9810416","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:16:27Z","timestamp":1658780187000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9810416\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,23]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/ets54262.2022.9810416","relation":{},"subject":[],"published":{"date-parts":[[2022,5,23]]}}}