{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:19:32Z","timestamp":1740100772284,"version":"3.37.3"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,23]],"date-time":"2022-05-23T00:00:00Z","timestamp":1653264000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,23]],"date-time":"2022-05-23T00:00:00Z","timestamp":1653264000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002701","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002701","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,23]]},"DOI":"10.1109\/ets54262.2022.9810467","type":"proceedings-article","created":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T19:37:54Z","timestamp":1656704274000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Hierarchical Memory Diagnosis"],"prefix":"10.1109","author":[{"given":"G. C.","family":"Medeiros","sequence":"first","affiliation":[{"name":"TU,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Fieback","sequence":"additional","affiliation":[{"name":"TU,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Gebregiorgis","sequence":"additional","affiliation":[{"name":"TU,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Taouil","sequence":"additional","affiliation":[{"name":"TU,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L. B.","family":"Poehls","sequence":"additional","affiliation":[{"name":"IDS, RWTH,Aachen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Hamdioui","sequence":"additional","affiliation":[{"name":"TU,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETS50041.2021.9465441"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_0840"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.79"},{"key":"ref6","article-title":"Fault pattern oriented defect diagnosis for memories","author":"wang","year":"2003","journal-title":"International Test Conference"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2007.4437418"},{"key":"ref5","article-title":"Hard-to-Detect Fault Analysis in FinFET SRAMs","author":"medeiros","year":"2021","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1991","author":"van de goor","key":"ref12"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2011.5783109"},{"key":"ref7","article-title":"FAME: a fault-pattern based memory failure analysis framework","author":"cheng","year":"2003","journal-title":"Int Conf on Computer Aided Design (ICCAD)"},{"key":"ref2","article-title":"Detecting faults in the peripheral circuits and an evaluation of SRAM tests","author":"goor","year":"2004","journal-title":"Int Test Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2008.4540243"},{"key":"ref1","article-title":"Memory Physical Aware Multi-Level Fault Diagnosis Flow","author":"harutyunyan","year":"2018","journal-title":"IEEE Transactions on Emerging Topics in Computing"}],"event":{"name":"2022 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2022,5,23]]},"location":"Barcelona, Spain","end":{"date-parts":[[2022,5,27]]}},"container-title":["2022 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9810327\/9810358\/09810467.pdf?arnumber=9810467","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:16:30Z","timestamp":1658780190000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9810467\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,23]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ets54262.2022.9810467","relation":{},"subject":[],"published":{"date-parts":[[2022,5,23]]}}}