{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:44:23Z","timestamp":1749620663075,"version":"3.37.3"},"reference-count":38,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.1109\/ets56758.2023.10173976","type":"proceedings-article","created":{"date-parts":[[2023,7,12]],"date-time":"2023-07-12T17:20:34Z","timestamp":1689182434000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors"],"prefix":"10.1109","author":[{"given":"Ferhat Can","family":"Ataman","sequence":"first","affiliation":[{"name":"Arizona State University,School of ECEE,Tempe,AZ"}]},{"given":"Mohammad","family":"Aladsani","sequence":"additional","affiliation":[{"name":"Arizona State University,School of ECEE,Tempe,AZ"}]},{"given":"Georgios","family":"Trichopoulos","sequence":"additional","affiliation":[{"name":"Arizona State University,School of ECEE,Tempe,AZ"}]},{"given":"Chethan Kumar","family":"Y.B.","sequence":"additional","affiliation":[{"name":"Texas Instruments,Banglore,India"}]},{"given":"Sule","family":"Ozev","sequence":"additional","affiliation":[{"name":"Arizona State University,School of ECEE,Tempe,AZ"}]}],"member":"263","reference":[{"key":"ref13","first-page":"442","article-title":"In-field recovery of rf circuits from wearout based performance degradation","volume":"8","author":"chang","year":"2017","journal-title":"TETC"},{"journal-title":"Antenna Theory Analysis and Design","year":"2015","author":"balanis","key":"ref35"},{"journal-title":"Imaging radar using cascaded mmwave sensor reference design","year":"2020","key":"ref12"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2017.7969005"},{"key":"ref15","first-page":"1","article-title":"Approximating the age of rf\/analog circuits through re-characterization and statistical estimation","author":"chang","year":"2014","journal-title":"DATE"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2015.2496220"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2014.6818774"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2018.2845451"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2017971"},{"key":"ref30","first-page":"1","article-title":"New methods for system level test of image projection and radar vlsi systems","author":"parekhji","year":"2022","journal-title":"IEEE VTS"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3092583"},{"key":"ref33","first-page":"295","article-title":"Broadband folded wilkinson power combiner\/splitter","volume":"14","author":"sun","year":"2004","journal-title":"IEEE MWCL"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3176014"},{"key":"ref32","first-page":"139","article-title":"A phased array rfic with built-in self-test capabilities","volume":"60","author":"inac","year":"2011","journal-title":"TMTT"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR.2004.1334537"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9365838"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342414"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2009.932078"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2975890"},{"key":"ref19","first-page":"172","article-title":"A 60ghz 65nm cmos rms power detector for antenna impedance mismatch detection","author":"gorisse","year":"2009","journal-title":"ESSCIRC"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2019.2899054"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437641"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378386"},{"key":"ref26","first-page":"512","article-title":"Digital calibration of RF transceivers for IQ imbalances and nonlinearity","author":"acar","year":"2007","journal-title":"ICCD"},{"key":"ref25","first-page":"1348","article-title":"Low cost MIMO testing for RF integrated circuits","volume":"18","author":"acar","year":"2009","journal-title":"TVLSI"},{"key":"ref20","first-page":"281","article-title":"A 60ghz cmos rectifier with 27.5dbm sensitivity for mm-wave power detection","author":"kawai","year":"2012","journal-title":"IEEE A-SSCC"},{"key":"ref22","first-page":"336","article-title":"DSP assisted low cost IQ mismatch measurement and compensation using built in power detector","author":"sen","year":"2010","journal-title":"MTT-S"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TBC.2015.2465138"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176656"},{"key":"ref27","first-page":"901","article-title":"Detailed characterization of transceiver parameters through loop-back-based bist","volume":"18","author":"erdogan","year":"2009","journal-title":"IEEE TVLSI"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2011.65"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2020.3025310"},{"key":"ref7","first-page":"1","article-title":"Introduction to mmwave sensing: Fmcw radars","author":"rao","year":"2017","journal-title":"Texas Instruments (TI) mmWave Training Series"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3036047"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2020.2978507"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2011.2178427"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2007.914635"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMC.2022.3214721"}],"event":{"name":"2023 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2023,5,22]]},"location":"Venezia, Italy","end":{"date-parts":[[2023,5,26]]}},"container-title":["2023 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10173930\/10173940\/10173976.pdf?arnumber=10173976","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T17:55:46Z","timestamp":1690912546000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10173976\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/ets56758.2023.10173976","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}