{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T15:27:18Z","timestamp":1780500438847,"version":"3.54.1"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.1109\/ets56758.2023.10174106","type":"proceedings-article","created":{"date-parts":[[2023,7,12]],"date-time":"2023-07-12T17:20:34Z","timestamp":1689182434000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs"],"prefix":"10.1109","author":[{"given":"Hanzhi","family":"Xun","sequence":"first","affiliation":[{"name":"Delft University of Technology,Computer Engineering Laboratory,Delft,The Netherlands,2628CD"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Moritz","family":"Fieback","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Computer Engineering Laboratory,Delft,The Netherlands,2628CD"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sicong","family":"Yuan","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Computer Engineering Laboratory,Delft,The Netherlands,2628CD"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ziwei","family":"Zhang","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Computer Engineering Laboratory,Delft,The Netherlands,2628CD"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mottaqiallah","family":"Taouil","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Computer Engineering Laboratory,Delft,The Netherlands,2628CD"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Computer Engineering Laboratory,Delft,The Netherlands,2628CD"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.12"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.206"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/EDSSC.2017.8126415"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3510851"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2278332"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2293354"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2016.44"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/el.2016.1693"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116247"},{"key":"ref21","article-title":"PuLP: A Linear Programming Toolkit for Python. 2011","author":"mitchell","year":"2011"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2202319"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1109\/JPROC.2012.2190369","article-title":"Metal–Oxide RRAM","volume":"100","author":"wong","year":"2012","journal-title":"Proc IEEE"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ETS50041.2021.9465401"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893615"},{"key":"ref19","year":"2012","journal-title":"Predictive Technology Model (PTM)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000029458.57095.bb"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2020.2982830"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.23"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2013.2253329"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624895"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838348"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000134"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2691263"}],"event":{"name":"2023 IEEE European Test Symposium (ETS)","location":"Venezia, Italy","start":{"date-parts":[[2023,5,22]]},"end":{"date-parts":[[2023,5,26]]}},"container-title":["2023 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10173930\/10173940\/10174106.pdf?arnumber=10174106","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T17:55:40Z","timestamp":1690912540000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10174106\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/ets56758.2023.10174106","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}