{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,2]],"date-time":"2026-10-02T17:11:07Z","timestamp":1790961067137,"version":"4.1.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.1109\/ets56758.2023.10174154","type":"proceedings-article","created":{"date-parts":[[2023,7,12]],"date-time":"2023-07-12T17:20:34Z","timestamp":1689182434000},"page":"1-6","source":"Crossref","is-referenced-by-count":7,"title":["BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell"],"prefix":"10.1109","author":[{"given":"Stefan","family":"Holst","sequence":"first","affiliation":[{"name":"Kyushu Institute of Technology,Iizuka,Japan,820-8502"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ruijun","family":"Ma","sequence":"additional","affiliation":[{"name":"Anhui University of Science and Technology,Huainan,China,232001"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaoqing","family":"Wen","sequence":"additional","affiliation":[{"name":"Kyushu Institute of Technology,Iizuka,Japan,820-8502"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Aibin","family":"Yan","sequence":"additional","affiliation":[{"name":"Anhui University,Hefei,China,230000"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hui","family":"Xu","sequence":"additional","affiliation":[{"name":"Anhui University of Science and Technology,Huainan,China,232001"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2004.1358812"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1057661.1057740"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2018.8400694"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2177135"},{"key":"ref20","author":"wang","year":"2006","journal-title":"VLSI Test Principles and Architectures Design for Testability (Systems on Silicon)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5533-5"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2014.16"},{"key":"ref21","year":"0","journal-title":"Predictive Technology Model for Spice"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2020.2975764"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1587\/transinf.2021EDP7216"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2019.8791544"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2018.00028"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2195"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0099"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1070"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.24"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2005.70"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2010.5560326"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.14"}],"event":{"name":"2023 IEEE European Test Symposium (ETS)","location":"Venezia, Italy","start":{"date-parts":[[2023,5,22]]},"end":{"date-parts":[[2023,5,26]]}},"container-title":["2023 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10173930\/10173940\/10174154.pdf?arnumber=10174154","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T17:56:07Z","timestamp":1690912567000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10174154\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/ets56758.2023.10174154","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}