{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T07:22:20Z","timestamp":1725780140976},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/ets61313.2024.10567079","type":"proceedings-article","created":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T17:54:49Z","timestamp":1719424489000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Counteracting Rowhammer by Data Alternation"],"prefix":"10.1109","author":[{"given":"Stefan A.","family":"Lung","sequence":"first","affiliation":[{"name":"Delft University of Technology,Faculty of Electrical Engineering, Mathematics and Computer Science,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georgi","family":"Gaydadjiev","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Faculty of Electrical Engineering, Mathematics and Computer Science,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Faculty of Electrical Engineering, Mathematics and Computer Science,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mottaqiallah","family":"Taouil","sequence":"additional","affiliation":[{"name":"Delft University of Technology,Faculty of Electrical Engineering, Mathematics and Computer Science,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/9780470544426"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1145\/2678373.2665726"},{"year":"2015","author":"Seaborn","article-title":"Exploiting the DRAM rowhammer bug to gain kernel privilege","key":"ref3"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/ISCA45697.2020.00059"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/HPCA51647.2021.00037"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ICCD53106.2021.00074"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1145\/3061639.3062281"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1145\/3316781.3317866"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/LCA.2016.2614497"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1145\/3307650.3322232"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1145\/3466752.3480069"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/DSN53405.2022.00054"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/IEDM.2017.8268437"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1016\/j.microrel.2015.12.027"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TNS.2022.3149487"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TED.2021.3060362"},{"article-title":"Genesys 2","key":"ref17"},{"author":"Vonk","article-title":"Instruction set: Introduces a simplified LC-3 instruction set","key":"ref18"},{"volume-title":"51204 - MIG 7 Series DDR2\/DDR3 - PHY Only Design Guide","year":"2014","key":"ref19"},{"volume-title":"Zynq-7000 SoC and 7 Series Devices Memory Interface Solutions v4.2","year":"2015","key":"ref20"},{"volume-title":"Micron: 4Gb: x4, x8, x16 DDR3 SDRAM Features","year":"2009","key":"ref21"}],"event":{"name":"2024 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2024,5,20]]},"location":"The Hague, Netherlands","end":{"date-parts":[[2024,5,24]]}},"container-title":["2024 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10567048\/10567052\/10567079.pdf?arnumber=10567079","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T04:36:31Z","timestamp":1719549391000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10567079\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/ets61313.2024.10567079","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}