{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,9]],"date-time":"2026-07-09T15:22:52Z","timestamp":1783610572549,"version":"3.55.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/ets61313.2024.10567161","type":"proceedings-article","created":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T17:54:49Z","timestamp":1719424489000},"page":"1-4","source":"Crossref","is-referenced-by-count":12,"title":["AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators"],"prefix":"10.1109","author":[{"given":"Mahdi","family":"Taheri","sequence":"first","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Natalia","family":"Cherezova","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Samira","family":"Nazari","sequence":"additional","affiliation":[{"name":"University of Zanjan,Zanjan,Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ahsan","family":"Rafiq","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ali","family":"Azarpeyvand","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tara","family":"Ghasempouri","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Masoud","family":"Daneshtalab","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jaan","family":"Raik","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Maksim","family":"Jenihhin","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3638242"},{"key":"ref2","article-title":"Dnn hardware reliability assessment and enhancement","volume-title":"27th IEEE European Test Symposium (ETS)","author":"Taheri"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2171993"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS56730.2022.9897818"},{"key":"ref5","article-title":"ScaleTRIM: scalable truncation-based integer approximate multiplier with linearization and compensation","author":"Farahmand","year":"2023"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3527156"},{"key":"ref7","doi-asserted-by":"crossref","DOI":"10.1145\/3126908.3126964","article-title":"Understanding error propagation in deep learning neural network (DNN) accelerators and applications","volume-title":"SC\u201917","author":"Li"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS56346.2023.10140043"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS57882.2023.10139468"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED60706.2024.10528372"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED57927.2023.10129353"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2019.101689"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SBCCI60457.2023.10261973"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3012673"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.1962.5219391"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2022.3212645"},{"key":"ref17","volume-title":"Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits","volume":"17","author":"Bushnell","year":"2004"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090716"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2015.7372600"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2890712"},{"key":"ref21","article-title":"Understanding error propagation in deep learning neural network (dnn) accelerators and applications","volume-title":"SC17","author":"Li"}],"event":{"name":"2024 IEEE European Test Symposium (ETS)","location":"The Hague, Netherlands","start":{"date-parts":[[2024,5,20]]},"end":{"date-parts":[[2024,5,24]]}},"container-title":["2024 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10567048\/10567052\/10567161.pdf?arnumber=10567161","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T04:55:54Z","timestamp":1719550554000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10567161\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/ets61313.2024.10567161","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}