{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T07:20:49Z","timestamp":1725780049805},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/ets61313.2024.10567172","type":"proceedings-article","created":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T17:54:49Z","timestamp":1719424489000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["What Would Interactive Testing With 1687 Look Like?"],"prefix":"10.1109","author":[{"given":"Michele","family":"Portolan","sequence":"first","affiliation":[{"name":"Univ Grenoble Alpes,CNRS, Grenoble INP1, TIMA,Grenoble,France,38000"}]},{"given":"Martin","family":"Keim","sequence":"additional","affiliation":[{"name":"Siemens Digital Industries SW"}]},{"given":"JF","family":"Cot\u00e9","sequence":"additional","affiliation":[{"name":"Siemens Digital Industries SW"}]},{"given":"Hans-Martin","family":"Von Staud","sequence":"additional","affiliation":[{"name":"Siemens Digital Industries SW"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2014.6974961"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2013.6515989"},{"key":"ref3","article-title":"IEEE std 1500 - Standard for Embedded Core Test"},{"key":"ref4","article-title":"IEEE 1687.2"}],"event":{"name":"2024 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2024,5,20]]},"location":"The Hague, Netherlands","end":{"date-parts":[[2024,5,24]]}},"container-title":["2024 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10567048\/10567052\/10567172.pdf?arnumber=10567172","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T04:51:31Z","timestamp":1719550291000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10567172\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/ets61313.2024.10567172","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}