{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T15:32:13Z","timestamp":1783697533631,"version":"3.55.0"},"reference-count":57,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/ets61313.2024.10567295","type":"proceedings-article","created":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T17:54:49Z","timestamp":1719424489000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations"],"prefix":"10.1109","author":[{"given":"Hanieh","family":"Jafarzadeh","sequence":"first","affiliation":[{"name":"University of Stuttgart,Stuttgart,Germany,70569"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Florian","family":"Klemme","sequence":"additional","affiliation":[{"name":"University of Stuttgart,Stuttgart,Germany,70569"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[{"name":"University of Stuttgart,Stuttgart,Germany,70569"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sybille","family":"Hellebrand","sequence":"additional","affiliation":[{"name":"Paderborn University,Paderborn,Germany,33098"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hans-Joachim","family":"Wunderlich","sequence":"additional","affiliation":[{"name":"University of Stuttgart,Stuttgart,Germany,70569"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/iolts59296.2023.10224872"},{"key":"ref4","article-title":"Detection and prevention of silent data corruption in an exabyte-scale database system","volume-title":"The 18th IEEE Workshop on Silicon Errors in Logic \u2013 System Effects","author":"Bacon"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3458336.3465297"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2023.3335195"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ITC51656.2023.00026"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-1713-9_44"},{"key":"ref9","volume-title":"A 14nm logic technology featuring 2nd-generation FinFET, air-gapped interconnects, self-aligned double patterning and a 0.0588 \u00b5m 2 SRAM cell size","author":"Natarajan","year":"2014"},{"key":"ref10","article-title":"BSIM-CMG 110.0.0: Multi-gate MOSFET compact model: technical manual","author":"Khandelwal","year":"2014"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2990672"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.833205"},{"key":"ref13","first-page":"200","article-title":"Self-testing of multichip logic modules","volume-title":"Proc. International Test Conference","author":"Bardel"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831584"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/FTCSH.1995.532648"},{"key":"ref16","volume-title":"VLSI test principles and architectures","author":"Wang","year":"2006"},{"key":"ref17","article-title":"LFSR-coded test patterns for scan designs","volume-title":"Proc. IEEE European Test Conference","author":"Konemann"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556959"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569803"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2006.12"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/test.2000.894197"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456997"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.25"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3285691"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035360"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.863742"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.32"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2014.373"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2602971"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2022.114774"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3100741"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.261012"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-8297-1"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-5597-1"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270315"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-75465-9"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2008.01.003"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/92.645062"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231090"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.62"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.03.007"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-023-06044-z"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.913191"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2014.6847806"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470686"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556983"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510877"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1049\/el:20061621"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2015.02.006"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557136"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231090"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.46"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437597"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-021-05979-5"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2006.13"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2598560"},{"key":"ref58","article-title":"IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device","volume-title":"IEEE, Tech. Rep."},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2017.2762903"}],"event":{"name":"2024 IEEE European Test Symposium (ETS)","location":"The Hague, Netherlands","start":{"date-parts":[[2024,5,20]]},"end":{"date-parts":[[2024,5,24]]}},"container-title":["2024 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10567048\/10567052\/10567295.pdf?arnumber=10567295","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T04:36:38Z","timestamp":1719549398000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10567295\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":57,"URL":"https:\/\/doi.org\/10.1109\/ets61313.2024.10567295","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}