{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,10]],"date-time":"2025-12-10T09:07:01Z","timestamp":1765357621145},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/ets61313.2024.10567352","type":"proceedings-article","created":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T17:54:49Z","timestamp":1719424489000},"page":"1-2","source":"Crossref","is-referenced-by-count":1,"title":["Online Detection of Unique Faults in RRAMs"],"prefix":"10.1109","author":[{"given":"Hanzhi","family":"Xun","sequence":"first","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Moritz","family":"Fieback","sequence":"additional","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammad Amin","family":"Yaldagard","sequence":"additional","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sicong","family":"Yuan","sequence":"additional","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hassen","family":"Aziza","sequence":"additional","affiliation":[{"name":"Aix-Marseille University,Marseille,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mottaqiallah","family":"Taouil","sequence":"additional","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715020"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000134"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838348"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3510851"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.206"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-16818-5_5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00085"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS56758.2023.10174113"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893615"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.5108654"}],"event":{"name":"2024 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2024,5,20]]},"location":"The Hague, Netherlands","end":{"date-parts":[[2024,5,24]]}},"container-title":["2024 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10567048\/10567052\/10567352.pdf?arnumber=10567352","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T04:36:38Z","timestamp":1719549398000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10567352\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ets61313.2024.10567352","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}