{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T15:00:05Z","timestamp":1784214005787,"version":"3.55.0"},"reference-count":76,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/ets61313.2024.10567471","type":"proceedings-article","created":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T17:54:49Z","timestamp":1719424489000},"page":"1-10","source":"Crossref","is-referenced-by-count":16,"title":["Reliability and Security of AI Hardware"],"prefix":"10.1109","author":[{"given":"Dennis","family":"Gnad","sequence":"first","affiliation":[{"name":"Karlsruhe Institute of Technology,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Martin","family":"Gotthard","sequence":"additional","affiliation":[{"name":"Karlsruhe Institute of Technology,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jonas","family":"Krautter","sequence":"additional","affiliation":[{"name":"Karlsruhe Institute of Technology,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Angeliki","family":"Kritikakou","sequence":"additional","affiliation":[{"name":"Inria, University of Rennes,France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Vincent","family":"Meyers","sequence":"additional","affiliation":[{"name":"Karlsruhe Institute of Technology,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Paolo","family":"Rech","sequence":"additional","affiliation":[{"name":"University of Trento,Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Josie E.","family":"Rodriguez Condia","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Annachiara","family":"Ruospo","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ernesto","family":"Sanchez","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Fernando Fernandes","family":"Dos Santos","sequence":"additional","affiliation":[{"name":"Inria, University of Rennes,France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Olivier","family":"Sentieys","sequence":"additional","affiliation":[{"name":"Inria, University of Rennes,France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mehdi","family":"Tahoori","sequence":"additional","affiliation":[{"name":"Karlsruhe Institute of Technology,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Russell","family":"Tessier","sequence":"additional","affiliation":[{"name":"University of Massachusetts,Amherst,United States"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Marcello","family":"Traiola","sequence":"additional","affiliation":[{"name":"Inria, University of Rennes,France"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HCS59251.2023.10254716"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2023.3256796"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2016.7929192"},{"key":"ref4","article-title":"Amazon AWS F1"},{"key":"ref5","volume-title":"AI and machine learning solutions","year":"2023"},{"key":"ref6","volume-title":"Machine learning and artificial intelligence","year":"2023"},{"key":"ref7","volume-title":"Azure machine learning - ML as a service","year":"2023"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2968129"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2444855"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2878387"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2014.49"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2024.3377596"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS48704.2020.9184683"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2018.00049"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/FCCM57271.2023.00025"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2023.i2.543-567"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VTS56346.2023.10139970"},{"key":"ref18","volume-title":"The international roadmap for devices and systems: 2022","year":"2022"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DFT59622.2023.10313541"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2884460"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2022.3142092"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3466752.3480111"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2022.3217841"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3550492"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/3195970.3195997"},{"key":"ref26","first-page":"372","article-title":"PNVBit: A dynamic binary instrumentation framework for NVIDIA GPUs","author":"Villa","year":"2019","journal-title":"MICRO"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3581784.3607086"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2013.6718358"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113660"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2017.01.009"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI54635.2022.00018"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/DSN48987.2021.00042"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC57769.2023.10321881"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA52012.2021.00075"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00036"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2022.3184274"},{"key":"ref37","article-title":"Nvidia gpu memory error management","year":"2024"},{"key":"ref38","article-title":"Generalized acceleration of matrix multiply accumulate operations","volume-title":"US Patent","author":"Boswell","year":"2019"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1145\/3458817.3476184"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/vts60656.2024.10538940"},{"key":"ref41","article-title":"Defect tolerant redundancy","volume-title":"US Patent","author":"Nickolls","year":"2005"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342176"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342119"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774686"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/DFT59622.2023.10313551"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13030578"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/SC.2016.20"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref49","article-title":"Faster R-CNN: Towards real-time object detection with region proposal networks","author":"Ren","year":"2015","journal-title":"NIPS"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01170"},{"key":"ref53","article-title":"Eva-02: A visual representation for Neon Genesis","author":"Fang","year":"2023","journal-title":"arxiv"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/ETS56758.2023.10174178"},{"key":"ref55","doi-asserted-by":"crossref","DOI":"10.1145\/3649329.3655688","article-title":"Cross-Layer Reliability Evaluation and Efficient Hardening of Large Vision Transformers Models","volume-title":"DAC","author":"Roquet","year":"2024"},{"key":"ref56","article-title":"Measuring the radiation reliability of SRAM structures in GPUs designed for HPC","author":"Rech","year":"2014","journal-title":"SELSE"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2012.6263960"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2021.3063083"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10137033"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2018.00034"},{"key":"ref61","first-page":"1","article-title":"Understanding error propagation in deep learning neural network (dnn) accelerators and applications","author":"Li","year":"2017","journal-title":"SC"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/DSN48987.2021.00018"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116571"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS56730.2022.9897813"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS59296.2023.10224882"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2024.3359572"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1145\/2435264.2435283"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342177"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1145\/3555048"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/FCCM51124.2021.00037"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10136956"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/FCCM53951.2022.9786107"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2021.3074608"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD45719.2019.8942094"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS57882.2023.10138941"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"}],"event":{"name":"2024 IEEE European Test Symposium (ETS)","location":"The Hague, Netherlands","start":{"date-parts":[[2024,5,20]]},"end":{"date-parts":[[2024,5,24]]}},"container-title":["2024 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10567048\/10567052\/10567471.pdf?arnumber=10567471","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,22]],"date-time":"2024-11-22T20:25:51Z","timestamp":1732307151000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10567471\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":76,"URL":"https:\/\/doi.org\/10.1109\/ets61313.2024.10567471","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}