{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T16:47:23Z","timestamp":1755794843837},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/ets61313.2024.10567479","type":"proceedings-article","created":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T17:54:49Z","timestamp":1719424489000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery"],"prefix":"10.1109","author":[{"given":"Anurup","family":"Saha","sequence":"first","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kwondo","family":"Ma","sequence":"additional","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chandramouli","family":"Amarnath","sequence":"additional","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abhijit","family":"Chatterjee","sequence":"additional","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-019-1677-2"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2022.971937"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s42256-021-00388-x"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC54400.2022.9939654"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3149577"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3223843"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS56758.2023.10174229"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1142\/S0129065720500276"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2016.2581700"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774625"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116244"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.884403"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00060"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1201.0490"}],"event":{"name":"2024 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2024,5,20]]},"location":"The Hague, Netherlands","end":{"date-parts":[[2024,5,24]]}},"container-title":["2024 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10567048\/10567052\/10567479.pdf?arnumber=10567479","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T04:58:17Z","timestamp":1719550697000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10567479\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ets61313.2024.10567479","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}