{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T15:14:53Z","timestamp":1761491693539,"version":"3.28.0"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/ets61313.2024.10567702","type":"proceedings-article","created":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T17:54:49Z","timestamp":1719424489000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Design-for-Test for Intermittent Faults in STT-MRAMs"],"prefix":"10.1109","author":[{"given":"Sicong","family":"Yuan","sequence":"first","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammad Amin","family":"Yaldagard","sequence":"additional","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hanzhi","family":"Xun","sequence":"additional","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Moritz","family":"Fieback","sequence":"additional","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Erik Jan","family":"Marinissen","sequence":"additional","affiliation":[{"name":"CognitiveIC,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Woojin","family":"Kim","sequence":"additional","affiliation":[{"name":"CognitiveIC,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siddharth","family":"Rao","sequence":"additional","affiliation":[{"name":"CognitiveIC,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sebastien","family":"Couet","sequence":"additional","affiliation":[{"name":"CognitiveIC,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mottaqiallah","family":"Taouil","sequence":"additional","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[{"name":"TU Delft,Delft,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","first-page":"33","article-title":"Spin-transfer torque MRAM (STT-MRAM): Challenges and prospects","volume":"18","author":"Huai","year":"2008","journal-title":"AAPPS bulletin"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM13553.2020.9371922"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/AICAS54282.2022.9869993"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IMW51353.2021.9439592"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2691263"},{"article-title":"Survey on STT-MRAM testing: Failure mechanisms, fault models, and tests","year":"2020","author":"Wu","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893615"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1997.599439"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2294080"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624725"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2015.39"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS52500.2021.9794178"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2017.2697963"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2017.2760861"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2536158"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9129130"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624749"},{"key":"ref18","article-title":"Device Aware Test for Memory Units","volume-title":"European patent","author":"Taouil","year":"2021"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.23919\/DATE51398.2021.9473999"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2907500"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/46\/13\/139601"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2017.2779151"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.09.028"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2021.3104764"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838493"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.019"},{"journal-title":"Predictive Technology Model (PTM)","year":"2012","key":"ref27"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000029458.57095.bb"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1142\/S0129156417400018"},{"volume-title":"Testing semiconductor memories: theory and practice.","year":"1991","author":"Van de Goor","key":"ref30"}],"event":{"name":"2024 IEEE European Test Symposium (ETS)","start":{"date-parts":[[2024,5,20]]},"location":"The Hague, Netherlands","end":{"date-parts":[[2024,5,24]]}},"container-title":["2024 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10567048\/10567052\/10567702.pdf?arnumber=10567702","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T04:51:08Z","timestamp":1719550268000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10567702\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/ets61313.2024.10567702","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}