{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T17:29:25Z","timestamp":1783790965223,"version":"3.55.0"},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,26]],"date-time":"2025-05-26T00:00:00Z","timestamp":1748217600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,26]],"date-time":"2025-05-26T00:00:00Z","timestamp":1748217600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,26]]},"DOI":"10.1109\/ets63895.2025.11049312","type":"proceedings-article","created":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T19:54:39Z","timestamp":1776974079000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["A UCIe Compatible Repair Scheme for the Clustered Faults in the Hexagonal Array of Interconnect Lanes"],"prefix":"10.1109","author":[{"given":"Zhaohong","family":"Lin","sequence":"first","affiliation":[{"name":"Peking University Shenzhen Graduate School,Key Lab of Integrated Microsystems,Shenzhen,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaole","family":"Cui","sequence":"additional","affiliation":[{"name":"Peking University Shenzhen Graduate School,Key Lab of Integrated Microsystems,Shenzhen,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Juncheng","family":"Pu","sequence":"additional","affiliation":[{"name":"Peking University Shenzhen Graduate School,Key Lab of Integrated Microsystems,Shenzhen,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Huan","family":"Yang","sequence":"additional","affiliation":[{"name":"Peking University Shenzhen Graduate School,Key Lab of Integrated Microsystems,Shenzhen,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","event":{"name":"2025 IEEE European Test Symposium (ETS)","location":"Tallinn, Estonia","start":{"date-parts":[[2025,5,26]]},"end":{"date-parts":[[2025,5,30]]}},"container-title":["2025 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11049305\/11049306\/11049312.pdf?arnumber=11049312","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T19:54:40Z","timestamp":1776974080000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11049312\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,26]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/ets63895.2025.11049312","relation":{},"subject":[],"published":{"date-parts":[[2025,5,26]]}}}