{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T05:13:56Z","timestamp":1783746836127,"version":"3.55.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,25]],"date-time":"2026-05-25T00:00:00Z","timestamp":1779667200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,25]],"date-time":"2026-05-25T00:00:00Z","timestamp":1779667200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,25]]},"DOI":"10.1109\/ets69887.2026.11591505","type":"proceedings-article","created":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T19:37:01Z","timestamp":1783712221000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Memory ECC Logic Testing using MBIST"],"prefix":"10.1109","author":[{"given":"Wei","family":"Zou","sequence":"first","affiliation":[{"name":"Siemens EDA,Wilsonville,OR,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Artur","family":"Pogiel","sequence":"additional","affiliation":[{"name":"Siemens EDA,Poznań,Poland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Martin","family":"Keim","sequence":"additional","affiliation":[{"name":"Siemens EDA,Orlando,FL,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Albert","family":"Au","sequence":"additional","affiliation":[{"name":"Siemens EDA,Ottawa,Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jongsin","family":"Yun","sequence":"additional","affiliation":[{"name":"Siemens EDA,Wilsonville,OR,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Luc","family":"Romain","sequence":"additional","affiliation":[{"name":"Siemens EDA,Ottawa,Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2015.57"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046237"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS63895.2025.11049625"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/54.922800"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ITCIndia66078.2025.11141614"},{"key":"ref6","volume-title":"Memory Test with In-line Error Correction Code Logic","author":"Gorman"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS65138.2025.11022822"},{"key":"ref8","journal-title":"Siemens EDA"},{"key":"ref9","journal-title":"Siemens EDA"}],"event":{"name":"2026 IEEE European Test Symposium (ETS)","location":"Chania, Greece","start":{"date-parts":[[2026,5,25]]},"end":{"date-parts":[[2026,5,29]]}},"container-title":["2026 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11591470\/11591504\/11591505.pdf?arnumber=11591505","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T05:00:27Z","timestamp":1783746027000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11591505\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,25]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ets69887.2026.11591505","relation":{},"subject":[],"published":{"date-parts":[[2026,5,25]]}}}