{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T05:14:19Z","timestamp":1783746859729,"version":"3.55.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,25]],"date-time":"2026-05-25T00:00:00Z","timestamp":1779667200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,25]],"date-time":"2026-05-25T00:00:00Z","timestamp":1779667200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,25]]},"DOI":"10.1109\/ets69887.2026.11591546","type":"proceedings-article","created":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T19:37:01Z","timestamp":1783712221000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["STA-Based Single Event Transient Propagation in Advanced Technology Nodes"],"prefix":"10.1109","author":[{"given":"Nikolaos","family":"Chatzivangelis","sequence":"first","affiliation":[{"name":"University of Thessaly,Department of Electrical and Computer Engineering,Greece"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Marios","family":"Karagiannis","sequence":"additional","affiliation":[{"name":"University of Thessaly,Department of Electrical and Computer Engineering,Greece"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Christos","family":"Georgakidis","sequence":"additional","affiliation":[{"name":"University of Thessaly,Department of Electrical and Computer Engineering,Greece"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nikolaos","family":"Sketopoulos","sequence":"additional","affiliation":[{"name":"University of Thessaly,Department of Electrical and Computer Engineering,Greece"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Marko","family":"Andjelkovic","sequence":"additional","affiliation":[{"name":"IHP - Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Luigi","family":"Dilillo","sequence":"additional","affiliation":[{"name":"IES, University of Montpellier, CNRS,Montpellier,France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Christos","family":"Sotiriou","sequence":"additional","affiliation":[{"name":"University of Thessaly,Department of Electrical and Computer Engineering,Greece"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2262002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147104"},{"issue":"1","key":"ref3","doi-asserted-by":"crossref","DOI":"10.1016\/j.microrel.2009.08.006","article-title":"Using Boolean satisfiability for computing soft error rates in early design stages","volume":"50","author":"Shazli","year":"2010","journal-title":"Microelectronics Reliability"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2012.6272020"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2867639"},{"issue":"6","key":"ref6","doi-asserted-by":"crossref","DOI":"10.1016\/j.microrel.2011.12.031","article-title":"Efficient algorithms to accurately compute derating factors of digital circuits","volume":"52","author":"Asadi","year":"2012","journal-title":"Microelectronics Reliability"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5365-0"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0959"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862738"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2006.143"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3035496"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSUSC.2018.2886640"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DFT59622.2023.10313533"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/electronics15040818"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.12681\/eadd\/56431"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED60706.2024.10528775"},{"key":"ref17","volume-title":"Analyzing interconnect effects on transient events via static timing analysis","author":"Chatzivangelis","year":"2024"},{"key":"ref18","first-page":"425","article-title":"Driver waveform computation for timing analysis with multiple voltage threshold driver models","volume-title":"Proceedings of the 45th annual Design Automation Conference","author":"Feldmann"},{"key":"ref19","volume-title":"IHP-Open-PDK GitHub Repository","year":"2025"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203889"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ESSERC62670.2024.10719536"}],"event":{"name":"2026 IEEE European Test Symposium (ETS)","location":"Chania, Greece","start":{"date-parts":[[2026,5,25]]},"end":{"date-parts":[[2026,5,29]]}},"container-title":["2026 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11591470\/11591504\/11591546.pdf?arnumber=11591546","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T05:03:27Z","timestamp":1783746207000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11591546\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,25]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/ets69887.2026.11591546","relation":{},"subject":[],"published":{"date-parts":[[2026,5,25]]}}}