{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T06:12:19Z","timestamp":1783750339642,"version":"3.55.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,25]],"date-time":"2026-05-25T00:00:00Z","timestamp":1779667200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,25]],"date-time":"2026-05-25T00:00:00Z","timestamp":1779667200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,25]]},"DOI":"10.1109\/ets69887.2026.11591696","type":"proceedings-article","created":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T19:37:01Z","timestamp":1783712221000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Re-sequencing ECC and Built-In Self-Repair with In-Page Fault Scrambling for Enhancing Yield and Reliability of Flash Memory"],"prefix":"10.1109","author":[{"given":"Shyue-Kung","family":"Lu","sequence":"first","affiliation":[{"name":"National Taiwan University of Science and Technology,Dept. of Electrical Engineering,Taipei,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qian-Rui","family":"Dong","sequence":"additional","affiliation":[{"name":"National Taiwan University of Science and Technology,Dept. of Electrical Engineering,Taipei,Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860599"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2013.190"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2049051"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2016.64"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401576"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ETS63895.2025.11049605"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.885828"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/BigData47090.2019.9006406"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/vts.2012.6231059"}],"event":{"name":"2026 IEEE European Test Symposium (ETS)","location":"Chania, Greece","start":{"date-parts":[[2026,5,25]]},"end":{"date-parts":[[2026,5,29]]}},"container-title":["2026 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11591470\/11591504\/11591696.pdf?arnumber=11591696","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T05:18:28Z","timestamp":1783747108000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11591696\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,25]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ets69887.2026.11591696","relation":{},"subject":[],"published":{"date-parts":[[2026,5,25]]}}}