{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T05:14:50Z","timestamp":1783746890179,"version":"3.55.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,25]],"date-time":"2026-05-25T00:00:00Z","timestamp":1779667200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,25]],"date-time":"2026-05-25T00:00:00Z","timestamp":1779667200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,25]]},"DOI":"10.1109\/ets69887.2026.11592016","type":"proceedings-article","created":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T19:37:01Z","timestamp":1783712221000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["NURSE: A Distributed Architecture for Runtime Fault Management in Processor Designs"],"prefix":"10.1109","author":[{"given":"Ashwin","family":"Santhosh","sequence":"first","affiliation":[{"name":"Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Artur","family":"Jutman","sequence":"additional","affiliation":[{"name":"Testonica Lab Oϋ,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Endri","family":"Kaja","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG,Munich,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wolfgang","family":"Ecker","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG,Munich,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Maksim","family":"Jenihhin","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.2"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2025.3602741"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2019.8875379"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT63277.2024.10753552"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253181"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1346281.1346315"},{"key":"ref8","article-title":"Silent data corruptions at scale","author":"Dixit"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CGO.2005.34"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2008.3"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IECON43393.2020.9255188"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2694344.2694348"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CPSNA.2013.6614242"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/HST47167.2019.9032955"},{"key":"ref15","first-page":"86","article-title":"Time redundancy based soft-error tolerance to rescue nanometer technologies","volume-title":"Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)","author":"Nicolaidis"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1982.1676066"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2016.7589605"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2017.2750902"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/NorCAS66540.2025.11231204"}],"event":{"name":"2026 IEEE European Test Symposium (ETS)","location":"Chania, Greece","start":{"date-parts":[[2026,5,25]]},"end":{"date-parts":[[2026,5,29]]}},"container-title":["2026 IEEE European Test Symposium (ETS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11591470\/11591504\/11592016.pdf?arnumber=11592016","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T05:07:20Z","timestamp":1783746440000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11592016\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,25]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/ets69887.2026.11592016","relation":{},"subject":[],"published":{"date-parts":[[2026,5,25]]}}}