{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,23]],"date-time":"2026-01-23T10:52:51Z","timestamp":1769165571161,"version":"3.49.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/etsym.2004.1347645","type":"proceedings-article","created":{"date-parts":[[2004,11,8]],"date-time":"2004-11-08T11:28:24Z","timestamp":1099913304000},"page":"140-145","source":"Crossref","is-referenced-by-count":53,"title":["Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution"],"prefix":"10.1109","author":[{"given":"L.","family":"Dilillo","sequence":"first","affiliation":[]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[]},{"given":"S.","family":"Pravossoudovitch","sequence":"additional","affiliation":[]},{"given":"A.","family":"Virazel","sequence":"additional","affiliation":[]},{"given":"S.","family":"Borri","sequence":"additional","affiliation":[]},{"given":"M.","family":"Hage-Hassan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915069"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843856"},{"key":"10","doi-asserted-by":"crossref","first-page":"18","DOI":"10.1109\/MDT.2002.1033788","article-title":"Resistance characterization of interconnect weak and strong open defects","volume":"19","author":"rodriquez","year":"2002","journal-title":"IEEE Design & Test of Computers"},{"key":"1","year":"0","journal-title":"\"International Technology Roadmap for Semiconductors (ITRS)\" 2003 Edition"},{"key":"7","first-page":"236","article-title":"Simple and efficient algorithms for functional RAM testing","author":"marinescu","year":"1982","journal-title":"Proc Int Test Conf"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2003.1231664"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011170"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2003.1231665"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1998.705953"},{"key":"8","author":"van de goor","year":"1998","journal-title":"Testing Semiconductor Memories Theory and Practice"},{"key":"11","article-title":"Analysis of a deceptive destructive read memory fault model and recommended testing","author":"adams","year":"1996","journal-title":"Proc IEEE North Atlantic Test Workshop"}],"event":{"name":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","location":"Corsica, France"},"container-title":["Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9329\/29640\/01347645.pdf?arnumber=1347645","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T07:38:28Z","timestamp":1497598708000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1347645\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/etsym.2004.1347645","relation":{},"subject":[]}}