{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T17:55:57Z","timestamp":1725386157548},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/etsym.2004.1347652","type":"proceedings-article","created":{"date-parts":[[2004,11,8]],"date-time":"2004-11-08T16:28:24Z","timestamp":1099931304000},"page":"160-165","source":"Crossref","is-referenced-by-count":5,"title":["Automatic test pattern generation for resistive bridging faults"],"prefix":"10.1109","author":[{"given":"P.","family":"Engelke","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"Polian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Renovell","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B.","family":"Becker","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1145\/944027.944036"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207759"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639698"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527915"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.156196"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894244"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990263"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894196"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1992.279362"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510877"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299240"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.804387"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512635"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008355411566"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292283"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519521"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557136"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1998.732156"},{"key":"6","first-page":"105","article-title":"PROBE: A PPSFP simulator for resistive bridging faults","author":"lee","year":"2000","journal-title":"VLSI Test Symp"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2003.1231674"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008326111919"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271093"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805784"}],"event":{"name":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","location":"Corsica, France"},"container-title":["Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9329\/29640\/01347652.pdf?arnumber=1347652","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T16:42:40Z","timestamp":1489509760000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1347652\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/etsym.2004.1347652","relation":{},"subject":[]}}