{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:10:51Z","timestamp":1725538251719},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,5]]},"DOI":"10.1109\/etsym.2010.5512734","type":"proceedings-article","created":{"date-parts":[[2010,7,23]],"date-time":"2010-07-23T13:52:00Z","timestamp":1279893120000},"page":"257-257","source":"Crossref","is-referenced-by-count":1,"title":["Setting test conditions for improving SRAM reliability"],"prefix":"10.1109","author":[{"given":"R. Alves","family":"Fonseca","sequence":"first","affiliation":[]},{"given":"L.","family":"Dilillo","sequence":"additional","affiliation":[]},{"given":"A.","family":"Bosio","sequence":"additional","affiliation":[]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[]},{"given":"S.","family":"Pravossoudovitch","sequence":"additional","affiliation":[]},{"given":"A.","family":"Virazel","sequence":"additional","affiliation":[]},{"given":"N.","family":"Badereddine","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2006.12"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469612"},{"key":"ref1","first-page":"258","article-title":"Impact of Random Dopant Fluctuation on Bulk CMOS 6-T SRAM Scaling","author":"cheng","year":"2006","journal-title":"Solid-State Device Research Conf"}],"event":{"name":"2010 15th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2010,5,24]]},"location":"Praha, Czech Republic","end":{"date-parts":[[2010,5,28]]}},"container-title":["2010 15th IEEE European Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5508193\/5512725\/05512734.pdf?arnumber=5512734","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T19:36:22Z","timestamp":1489865782000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5512734\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/etsym.2010.5512734","relation":{},"subject":[],"published":{"date-parts":[[2010,5]]}}}