{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T13:23:28Z","timestamp":1725629008467},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,5]]},"DOI":"10.1109\/etsym.2010.5512736","type":"proceedings-article","created":{"date-parts":[[2010,7,23]],"date-time":"2010-07-23T09:52:00Z","timestamp":1279878720000},"page":"255-255","source":"Crossref","is-referenced-by-count":2,"title":["A shared BIST optimization methodology for memory test"],"prefix":"10.1109","author":[{"given":"Lilia","family":"Zaourar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jihane Alami","family":"Chentoufi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yann","family":"Kieffer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arnaud","family":"Wenzel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Frederic","family":"Grandvaux","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref3","article-title":"A memory grouping method for sharing memory BIST logic","author":"miyazaki","year":"2006","journal-title":"Proceedings of the 2006 Asia and South Pacific Design Automation Conference"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2003.1232242"},{"key":"ref1","first-page":"4","article-title":"A distributed BIST Control Scheme for complex VUI devices, The 11'","author":"zorian","year":"1993","journal-title":"IEEE VLSI Test Symposium"}],"event":{"name":"2010 15th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2010,5,24]]},"location":"Praha, Czech Republic","end":{"date-parts":[[2010,5,28]]}},"container-title":["2010 15th IEEE European Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5508193\/5512725\/05512736.pdf?arnumber=5512736","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T15:36:24Z","timestamp":1489851384000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5512736\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/etsym.2010.5512736","relation":{},"subject":[],"published":{"date-parts":[[2010,5]]}}}