{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T09:01:42Z","timestamp":1725699702885},"reference-count":1,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,5]]},"DOI":"10.1109\/etsym.2010.5512739","type":"proceedings-article","created":{"date-parts":[[2010,7,23]],"date-time":"2010-07-23T13:52:00Z","timestamp":1279893120000},"page":"254-254","source":"Crossref","is-referenced-by-count":3,"title":["A diagnostic test generation system and a coverage metric"],"prefix":"10.1109","author":[{"given":"Yu","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vishwani D.","family":"Agrawal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2010.5550345"}],"event":{"name":"2010 15th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2010,5,24]]},"location":"Praha, Czech Republic","end":{"date-parts":[[2010,5,28]]}},"container-title":["2010 15th IEEE European Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5508193\/5512725\/05512739.pdf?arnumber=5512739","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T19:40:21Z","timestamp":1489866021000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5512739\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5]]},"references-count":1,"URL":"https:\/\/doi.org\/10.1109\/etsym.2010.5512739","relation":{},"subject":[],"published":{"date-parts":[[2010,5]]}}}