{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T03:18:07Z","timestamp":1729653487505,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,5]]},"DOI":"10.1109\/etsym.2010.5512766","type":"proceedings-article","created":{"date-parts":[[2010,7,23]],"date-time":"2010-07-23T09:52:00Z","timestamp":1279878720000},"page":"145-150","source":"Crossref","is-referenced-by-count":4,"title":["A Built-In Self-Test scheme for high speed I\/O using cycle-by-cycle edge control"],"prefix":"10.1109","author":[{"given":"Hyunjin","family":"Kim","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaeyong","family":"Chung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacob A.","family":"Abraham","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eonjo","family":"Byun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cheol-Jong","family":"Woo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"23","article-title":"Ac io loopback design for high speed uprocessor io test","author":"provost","year":"2004","journal-title":"Proc Int Test Conf"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.818569"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.818295"},{"key":"ref13","first-page":"1579","volume":"17","author":"jia","year":"2009","journal-title":"A dll design for testing i\/o setup and hold times"},{"key":"ref14","first-page":"52","article-title":"A high speed bist architecture for ddr-sdram testing","author":"shen","year":"2005","journal-title":"Proc IEEE Int Workshop on Memory Technology Design and Testing"},{"key":"ref15","first-page":"1023","article-title":"A bist solution for the test of i\/o speed","author":"jia","year":"2003","journal-title":"Proc Int Test Conf"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/SSST.2009.4806779"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.36"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2000.852868"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2009.2012432"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.853602"},{"journal-title":"Vitesse purchases fusion for testing serdes serial-ata and pci express devices","year":"2004","author":"yerganian","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EPEP.2005.1563685"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2016135"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271089"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.25"},{"key":"ref2","article-title":"Testing high-speed protocol based rambus dram","author":"kang","year":"1999","journal-title":"Hewlett-Packard Company California Semiconductor Test Division Application Note"},{"key":"ref1","first-page":"68","article-title":"Digitally-controlled dll and i\/o circuits for 500mb\/s\/pin x 16 ddr sdram","author":"lee","year":"2001","journal-title":"Proc IEEE Int Solid-State Circuits Conf"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"446","DOI":"10.1109\/TEST.2002.1041794","article-title":"Complete, contactless i\/o testing - reaching the boundary in minimizing digital ic testing cost","author":"sunter","year":"2002","journal-title":"Proc Int Test Conf"}],"event":{"name":"2010 15th IEEE European Test Symposium (ETS)","start":{"date-parts":[[2010,5,24]]},"location":"Praha, Czech Republic","end":{"date-parts":[[2010,5,28]]}},"container-title":["2010 15th IEEE European Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5508193\/5512725\/05512766.pdf?arnumber=5512766","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T07:21:15Z","timestamp":1497856875000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5512766\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/etsym.2010.5512766","relation":{},"subject":[],"published":{"date-parts":[[2010,5]]}}}