{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T10:50:27Z","timestamp":1774349427094,"version":"3.50.1"},"reference-count":11,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/etw.2002.1029644","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T18:14:31Z","timestamp":1056564871000},"page":"89-94","source":"Crossref","is-referenced-by-count":40,"title":["A high accuracy triangle-wave signal generator for on-chip ADC testing"],"prefix":"10.1109","author":[{"given":"S.","family":"Bernard","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Azais","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Bertrand","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Renovell","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1997.582382"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639692"},{"key":"ref10","author":"mahoney","year":"1987","journal-title":"DSP-Based Testing of Analog and Mixed-Signal Integrated Circuits"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2000.873779"},{"key":"ref11","article-title":"Efficient on-chip generator for linear histogram BIST of ADCs","author":"bernard","year":"2001","journal-title":"Proc International Mixed-Signal Testing Workshop"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843852"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805778"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528010"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/82.532008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923449"},{"key":"ref1","first-page":"307","article-title":"Hybrid Built-In Self-Test (HBIST) for Mixed Analogue\/Digital Integrated Circuits","author":"ohletz","year":"1991","journal-title":"Proc European Test Conference"}],"event":{"name":"The Seventh IEEE European Test Workshop","location":"Corfu, Greece","acronym":"ETW-02"},"container-title":["Proceedings The Seventh IEEE European Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7996\/22118\/01029644.pdf?arnumber=1029644","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,10]],"date-time":"2017-03-10T16:14:20Z","timestamp":1489162460000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1029644\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/etw.2002.1029644","relation":{},"subject":[]}}